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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2020-06-16T06:33:19Z BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. Chen, Pin-Shiang;Lee, Shou-Chung;Oates, A. S.;Liu, Chee Wee; Chen, Pin-Shiang; Lee, Shou-Chung; Oates, A. S.; Liu, Chee Wee; CHEE-WEE LIU
國立交通大學 2017-04-21T06:49:41Z Limitation of low-k reliability due to dielectric breakdown at vias Lee, Shou-Chung; Oates, A. S.; Chang, Kow Ming
國立交通大學 2017-04-21T06:49:40Z FUNDAMENTAL UNDERSTANDING OF POROUS LOW-K DIELECTRIC BREAKDOWN Lee, Shou-Chung; Oates, A. S.; Chang, Kow-Ming
國立交通大學 2015-12-02T03:00:54Z Exploring Location-Related Data on Smart Phones for Activity Inference Ruan, Xiao-Wen; Lee, Shou-Chung; Peng, Wen-Chih
國立交通大學 2014-12-12T02:14:46Z 砷離子佈植砷化鎵薄膜在不同退火條件下其材料結構與電性分析 李守忠; Lee, Shou-Chung; 張振雄; Chen-Shiung Chang
國立交通大學 2014-12-12T01:21:34Z 低介電係數材料應用於銅導線內連接製程之可靠度研究 李守忠; Lee, Shou-Chung; 張國明; Chang, Kow-Ming
國立交通大學 2014-12-08T15:48:26Z Geometric Variability of Nanoscale Interconnects and Its Impact on the Time-Dependent Breakdown of Cu/Low-k Dielectrics Lee, Shou-Chung; Oates, Anthony S.; Chang, Kow-Ming

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