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Showing items 76-98 of 98 (4 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:15:10Z |
Improvement of negative-bias-temperature instability in SiN-capped p-channel metal-oxide-semiconductor field-effect transistors using ultrathin HfO2 buffer layer
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Lu, Ching-Sen; Horng-Chih, Lin; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:14:38Z |
Impacts of SiN-capping layer on the device characteristics and hot-carrier degradation of nMOSFETs
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Lu, Chia-Yu; Lin, Horng-Chih; Lee, Yao-Jen; Shie, Yu-Lin; Chao, Chih-Cheng |
| 國立交通大學 |
2014-12-08T15:14:29Z |
Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN capping
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Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:13:28Z |
Performance enhancement by local strain in (110) channel n-channel metal-oxide-semicondiactor field-effect transistors on (111) substrate
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Lo, Wen-Cheng; Ku, Ya-Hsin; Lee, Yao-Jen; Chao, Tien-Sheng; Chang, Chun-Yen |
| 國立交通大學 |
2014-12-08T15:13:11Z |
High-performance short-channel double-gate low-temperature polysilicon thin-film transistors using excimer laser crystallization
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Tsai, Chun-Chien; Wei, Kai-Fang; Lee, Yao-Jen; Chen, Hsu-Hsin; Wang, Jyh-Liang; Lee, I-Che; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:13:06Z |
Polycrystalline silicon thin-film transistors with location-controlled crystal grains fabricated by excimer laser crystallization
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Tsai, Chun-Chien; Lee, Yao-Jen; Chiang, Ko-Yu; Wang, Jyh-Liang; Lee, I-Che; Chen, Hsu-Hsin; Wei, Kai-Fang; Chang, Ting-Kuo; Chen, Bo-Ting; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:12:06Z |
Fabrication and characterization of excimer laser crystallized double-gate low-temperature poly-silicon thin film transistors
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Tsai, Chun-Chien; Wei, Kai-Fang; Lee, Yao-Jen; Lee, I-Che; Chen, Hsu-Hsin; Wang, Jyh-Liang; Chen, Hsai-Wei; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:11:55Z |
Evolution of RESET current and filament morphology in low-power HfO(2) unipolar resistive switching memory
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Hou, Tuo-Hung; Lin, Kuan-Liang; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Electrode dependence of filament formation in HfO(2) resistive-switching memory
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Lin, Kuan-Liang; Hou, Tuo-Hung; Shieh, Jiann; Lin, Jun-Hung; Chou, Cheng-Tung; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:09:26Z |
Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer
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Lu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:09:05Z |
Observation of localized surface plasmons in spatially controlled array structures
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Chou, J. W.; Lin, Kao-Chin; Lee, Yao-Jen; Yuan, Chi-Tsu; Hsueh, Fu-Kuo; Shih, Hsun-Chuan; Fan, Wen-Chung; Luo, Chih-Wei; Lin, Ming-Chieh; Chou, Wu-Ching; Chuu, Der-San |
| 國立交通大學 |
2014-12-08T15:09:04Z |
Effects of Plasma Damage on Metal-insulator-Metal Capacitors and Transistors for Advanced Mixed-Signal/Radio-Frequency Metal-Oxide-Semiconductor Field-Effect Transistor Technology
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Weng, Wu-Te; Lee, Yao-Jen; Lin, Hong-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:08:32Z |
Fluorescence signals of quantum dots influenced by spatially controlled array structures
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Chou, J. W.; Lin, K. C.; Tang, Y. T.; Hsueh, F. K.; Lee, Yao-Jen; Luo, C. W.; Chen, Y. N.; Yuan, C. T.; Shih, Hsun-Chuan; Fan, W. C.; Lin, M. C.; Chou, W. C.; Chuu, D. S. |
| 國立交通大學 |
2014-12-08T15:07:08Z |
A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO(2)/poly-gate complementary metal oxide semiconductor technology
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Weng, Wu-Te; Lee, Yao-Jen; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:06:58Z |
Nanoscale p-MOS Thin-Film Transistor With TiN Gate Electrode Fabricated by Low-Temperature Microwave Dopant Activation
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Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Ching; Cheng, Tz-Yen; Kowalski, Jeff M.; Kowalski, Jeff E.; Lee, Yao-Jen; Chao, Tien-Sheng; Wu, Ching-Yi |
| 國立交通大學 |
2014-12-08T15:06:23Z |
Impacts of low-pressure chemical vapor deposition-SiN capping layer and lateral distribution of interface traps on hot-carrier stress of n-channel metal-oxide-semiconductor field-effect-transistors
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Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lu, Chia-Yu; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:02:04Z |
Trapping and de-trapping characteristics in PBTI and dynamic PBTI between HfO2 and HfSiON gate dielectrics
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Lin, We-Liang; Lee, Yao-Jen; Lo, Wen-Cheng; Chen, King-Sheng; Hou, Y. T.; Lin, K. C.; Chao, Tien-Sheng |
| 國立臺灣大學 |
2012 |
Sub fM DNA sensitivity by self-aligned maskless thin-film transistor-based SoC bioelectronics
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Chen, Min-Cheng; Lin, Chang-Hsien; Lin, Chia-Yi; Hsueh, Fu-Kuo; Huang, Wen-Hsien; Lien, Yu-Chung; Chen, Hsiu-Chih; Hsueh, Hsiao-Ting; Huang, Che-Wei; Lin, Chih-Ting; Liu, Yin-Chih; Lee, Ta-Hsien; Hua, Mu-Yi; Qiu, Jian-Tai; Liu, Mao-Chen; Lee, Yao-Jen; Shieh, Jia-Min; Ho, ChiaHua; Hu, Chenming; Yang, Fu-Liang |
| 國立成功大學 |
2011 |
Silicon Mach-Zehnder Waveguide Interferometer on Silicon-on-Silicon (SOS) Substrate Incorporating the Integrated Three-Terminal Field-Effect Device as an Optical Signal Modulation Structure
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Chuang, Ricky W.; Hsu, Mao-Teng; Chou, Shen-Horng; Lee, Yao-Jen |
| 大葉大學 |
2010-05 |
Nanoscale p-MOS Thin-Film Transistor with TiN Gate Electrode Fabricated by Low-Temperature Microwave Dopant Activation
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Lu, Yu-Lun;Hsueh, Fu-Kuo;Huang, Kuo-Ching;Cheng, Tz-Yen;Kowalski, Jeff M.;Kowalski, Jeff E.;Lee, Yao-Jen;Chao, Tien-Sheng;Wu, Ching-Yi |
| 國立成功大學 |
2009-10-14 |
Fluorescence signals of quantum dots influenced by spatially controlled array structures
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Chou, J. W.; Lin, K. C.; Tang, Y. T.; Hsueh, F. K.; Lee, Yao-Jen; Luo, C. W.; Chen, Yueh-Nan; Yuan, C. T.; Shih, Hsun-Chuan; Fan, W. C.; Lin, M. C.; Chou, W. C.; Chuu, D. S. |
| 大葉大學 |
2009-02 |
A Low Temperature Microwave Anneal Process for Boron-doped Ultra-Thin Ge Epi-layer on Si Substrate
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Lee, Yao-Jen;Hsueh, Fu-Kuo;Huang, Shih-Chiang;Kowalski, Jeff M.;Kowalski, Jeff E.;Cheng, Alex T. Y.;Koo, Ann;Luo, Guang-Li;Wu, Ching-Yi |
| 國立臺灣大學 |
2005 |
胃幽門螺旋桿菌經由活化粒線體訊息傳導途徑進而調控TRAIL引發細胞凋亡之研究
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李曜任; Lee, Yao-Jen |
Showing items 76-98 of 98 (4 Page(s) Totally)
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