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| 國立臺灣大學 |
1991 |
Analytical Imaging with a Scanning Ion Microprobe
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C. |
| 國立臺灣大學 |
1990 |
Dendritic Oxide Growth on the Surface of Liquid Gallium
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王玉麟; Raval, A.; Levi-Setti, R.; Wang, Yuh-Lin; Raval, A.; Levi-Setti, R. |
| 國立臺灣大學 |
1989 |
Advanced Imaging and Analysis Techniques with a Scanning Ion Microprobe
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王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R. |
| 國立臺灣大學 |
1989 |
Advances in Processing High-Temperature Superconducting Thin Films with Lasers
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王玉麟; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1989 |
High Resolution SIMS Imaging of Multilayer Deposited High-Tc Thin Films
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K. |
| 國立臺灣大學 |
1989 |
Secondary Ion Imaging Microanalysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P. |
| 國立臺灣大學 |
1989 |
The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P. |
| 國立臺灣大學 |
1989 |
Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
| 國立臺灣大學 |
1989 |
Ion Microprobe Analysis of Laser-Deposited Y-Ba-Cu Thin Film:Effects of Anneal Temperature
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Venkateasan, T.; Wu, X. D.; Inam, A.; Dutta, B. |
| 國立臺灣大學 |
1989 |
Ion Microprobe Characterization of E-Beam Deposited Y-Ba-Cu(F)O Films:Effects of Post-Deposition Processing
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王玉麟; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K.; Wang, Yuh-Lin; Chabala, J. M.; Chang, R. P. R.; Ketterson, J. B.; Levi-Setti, R.; Li, D. X.; Wang, X. K. |
| 國立臺灣大學 |
1989 |
Microanalysis of Precipatitates in Aluminum-Lithium Alloys with a Scnning Ion Microscrope
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王玉麟; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E.; Wang, Yuh-Lin; Williams, D. B.; Levi-Setti, R.; Chabala, J. M.; Newbury, D. E. |
| 國立臺灣大學 |
1988 |
Angle Defined Secondary Ion Energy Spectra from Cesium-Modified Aluminum Surfaces
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1988 |
Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
| 國立臺灣大學 |
1988 |
High Resolution Ion Probe Imaging and Analysis
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Hallegot, P. |
| 國立臺灣大學 |
1988 |
Scanning Ion Microscopy Images
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1988 |
Effect of Weak Uniform Frustratation on the Resistive Transition in a Josephson Junction Array
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王玉麟; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G.; Wang, Yuh-Lin; Carini, P.; Nagel, S. R.; Levi-Setti, R.; Chabala, J. M.; Grow, G. |
| 國立臺灣大學 |
1988 |
Micro-Secondary Ion Mass Spectroscopy:Physical and Instrumental Factors Affecting the Resolution
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1988 |
Practical Resolution Limits of Imaging Microanalysis with a Scanning Ion Microscope
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王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin; Chabala, J. M.; Levi-Setti, R. |
| 國立臺灣大學 |
1987 |
Imaging SIMS at 20 nm Lateral Resolution:Exploratory Research Applications
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王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin; Levi-Setti, R.; Crow, G. |
| 國立臺灣大學 |
1987 |
Aspects of High Resolution Imaging with Scanning Ion Microprobe
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1987 |
High Resolution Scanning Ion Microprobe Analysis of Retinal Tissue
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王玉麟; Burns, M. S.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Burns, M. S.; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1986 |
A Proposal for a High Resolution Scanning Ion Microprobe Based on Laser Non-Resonant Post-Ionization of Sputtered Atoms
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
| 國立臺灣大學 |
1986 |
Analytical Applications of Focused Ion Beams
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王玉麟; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G. |
| 國立臺灣大學 |
1986 |
High Resolution SIMS Imaging Microanalysis of Soft Biological Tissue
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Chandra, S.; Morrison G. H.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M.; Chandra, S.; Morrison G. H. |
| 國立臺灣大學 |
1986 |
High Resolution Structural Information Revealed by Scanning Ion Microprobe Imaging
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王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin; Levi-Setti, R.; Chabala, J. M. |
Showing items 1-25 of 37 (2 Page(s) Totally)
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View [10|25|50] records per page
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