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Taiwan Academic Institutional Repository >
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"li fu hai"
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| 國立交通大學 |
2017-04-21T06:48:29Z |
Electrical performance and photo-responses enhancement by in situ nitrogen incorporation to amorphous InGaZnO thin-film transistors
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Teng, Li-Feng; Liu, Po-Tsun; Fuh, Chur-Shyang; Chou, Yi-Teh; Li, Fu-Hai; Chang, Chih-Hsiang; Shieh, Han-Ping D. |
| 國立交通大學 |
2015-12-02T02:59:29Z |
Characterization of the charge trapping properties in p-channel silicon-oxide-nitride-oxide-silicon memory devices including SiO2/Si3N4 interfacial transition layer
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Chiu, Yung-Yueh; Yang, Bo-Jun; Li, Fu-Hai; Chang, Ru-Wei; Sun, Wein-Town; Lo, Chun-Yuan; Hsu, Chia-Jung; Kuo, Chao-Wei; Shirota, Riichiro |
| 國立交通大學 |
2014-12-12T02:36:08Z |
非揮發性快閃記憶體元件電荷分佈與可靠度之探討
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李富海; Li, Fu-Hai; 白田理一郎; Shirota, Riichiro |
| 國立交通大學 |
2014-12-12T01:49:45Z |
新穎式透明非晶態氧化銦鎵鋅薄膜電晶體穩定性之研究
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李富海; Li, Fu-Hai; 劉柏村; Liu, Po-Tsun |
| 國立交通大學 |
2014-12-08T15:39:18Z |
3D Device Simulation of Work Function and Interface Trap Fluctuations on High-kappa/Metal Gate Devices
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Cheng, Hui-Wen; Li, Fu-Hai; Han, Ming-Hung; Yiu, Chun-Yen; Yu, Chia-Hui; Lee, Kuo-Fu; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:37:36Z |
Nitrogenated amorphous InGaZnO thin film transistor
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Liu, Po-Tsun; Chou, Yi-Teh; Teng, Li-Feng; Li, Fu-Hai; Shieh, Han-Ping |
| 國立交通大學 |
2014-12-08T15:31:35Z |
Study Trapped Charge Distribution in P-Channel Silicon-Oxide-Nitride-Oxide-Silicon Memory Device Using Dynamic Programming Scheme
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Li, Fu-Hai; Chiu, Yung-Yueh; Lee, Yen-Hui; Chang, Ru-Wei; Yang, Bo-Jun; Sun, Wein-Town; Lee, Eric; Kuo, Chao-Wei; Shirota, Riichiro |
| 國立交通大學 |
2014-12-08T15:31:14Z |
Impact of Source/Drain Junction and Cell Shape on Random Telegraph Noise in NAND Flash Memory
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Li, Fu-Hai; Shirota, Riichiro |
| 國立交通大學 |
2014-12-08T15:26:32Z |
Ambient Stability Enhancement of Thin-Film Transistor With InGaZnO Capped With InGaZnO:N Bilayer Stack Channel Layers
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Liu, Po-Tsun; Chou, Yi-Teh; Teng, Li-Feng; Li, Fu-Hai; Fuh, Chur-Shyang; Shieh, Han-Ping D. |
| 國立交通大學 |
2014-12-08T15:24:12Z |
A New Programming Scheme for the Improvement of Program Disturb Characteristics in Scaled NAND Flash Memory
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Shirota, Riichiro; Huang, Chen-Hao; Nagai, Shinji; Sakamoto, Yoshinori; Li, Fu-Hai; Mitiukhina, Nina; Arakawa, Hideki |
Showing items 1-10 of 10 (1 Page(s) Totally)
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