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| 臺大學術典藏 |
2018-09-10T06:31:01Z |
Multilevel full-chip routing with testability and yield enhancement
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Li, K.S.-M.; Chang, Y.-W.; Lee, C.-L.; Su, C.; Chen, J.E.; YAO-WEN CHANG |
| 臺大學術典藏 |
2018-09-10T05:58:33Z |
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
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Li, K.S.-M.; Su, C.; Chang, Y.-W.; Lee, C.-L.; Chen, J.E.; YAO-WEN CHANG |
| 臺大學術典藏 |
2018-09-10T05:58:33Z |
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
|
Li, K.S.-M.; Chang, Y.-W.; Su, C.; Lee, C.-L.; Chen, J.E.; YAO-WEN CHANG |
| 臺大學術典藏 |
2018-09-10T05:23:29Z |
Multilevel full-chip routing with testability and yield enhancement
|
Li, K.S.-M.; Lee, C.-L.; Chang, Y.-W.; Su, C.; Chen, J.-E.; YAO-WEN CHANG |
| 國立臺灣大學 |
2006 |
P1500 Standard Compatible Interconnect Diagnosis for Delay and Crosstalk Faults
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Li, K. S.-M.; Su, C.-C.; Chang, Y.-W.; Lee, C.-L.; Chen, J. E |
Showing items 1-5 of 5 (1 Page(s) Totally)
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