|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"li tien yeh"
Showing items 1-11 of 11 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立交通大學 |
2014-12-12T01:28:15Z |
奈米級靜態隨機存取記憶體之特性擾動及其壓抑技術
|
李典燁; Li, Tien-Yeh; 李義明; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:25:39Z |
Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits
|
Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung; Lee, Kuo-Fu; Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:49Z |
Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Characteristics Variability of Novel Lateral Asymmetry Nano-MOSFETs due to Random Discrete Dopant
|
Lee, Kou-Fu; Hwang, Chih-Hong; Li, Tien-Yeh; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:09:31Z |
Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit
|
Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh |
| 國立交通大學 |
2014-12-08T15:09:07Z |
The geometric effect and programming current reduction in cylindrical-shaped phase change memory
|
Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:09:00Z |
Random-Dopant-Induced Variability in Nano-CMOS Devices and Digital Circuits
|
Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh |
| 國立交通大學 |
2014-12-08T15:07:27Z |
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies
|
Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:02:42Z |
Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit
|
Li, Yiming; Hwang, Chih-Hong; Yeh, Ta-Ching; Huang, Hsuan-Ming; Li, Tien-Yeh; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Comprehensive Examination of Threshold Voltage Fluctuations in Nanoscale Planar MOSFET and Bulk FinFET Devices
|
Hwang, Chih-Hong; Cheng, Hui-Wen; Yeh, Ta-Ching; Li, Tien-Yeh; Huang, Hsuan-Ming; Li, Yiming |
Showing items 1-11 of 11 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
