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| 國立成功大學 |
2023-11-1 |
Reaping Both Latency and Reliability Benefits with Elaborate Sanitization Design for 3D TLC NAND Flash
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何建忠; HO, CHIEN-CHUNG; Wang, Wei-Chen;Ho, Chien-Chung;Li, Yung-Chun;Chen, Liang-Chi;Chang, Yu-Ming |
| 臺大學術典藏 |
2015 |
Achieving SLC performance with MLC flash memory.
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Li, Hsiang-Pang; TEI-WEI KUO; Li, Yung-Chun; Kuo, Tei-Wei; Chang, Yu-Ming; Chang, Yuan-Hao; Chang, Yu-Ming;Chang, Yuan-Hao;Kuo, Tei-Wei;Li, Yung-Chun;Li, Hsiang-Pang |
| 臺大學術典藏 |
2015 |
Achieving SLC performance with MLC flash memory.
|
Li, Hsiang-Pang; TEI-WEI KUO; Li, Yung-Chun; Kuo, Tei-Wei; Chang, Yu-Ming; Chang, Yuan-Hao; Chang, Yu-Ming;Chang, Yuan-Hao;Kuo, Tei-Wei;Li, Yung-Chun;Li, Hsiang-Pang |
| 臺大學術典藏 |
2015 |
On Relaxing Page Program Disturbance over 3D MLC Flash Memory.
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Chang, Yuan-Hao; Li, Yung-Chun; Chang, Yu-Ming; Chang, Yu-Ming;Li, Yung-Chun;Chang, Yuan-Hao;Kuo, Tei-Wei;Hsieh, Chih-Chang;Li, Hsiang-Pang; TEI-WEI KUO; Li, Hsiang-Pang; Hsieh, Chih-Chang; Kuo, Tei-Wei |
| 臺大學術典藏 |
2015 |
On Relaxing Page Program Disturbance over 3D MLC Flash Memory.
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Chang, Yuan-Hao; Li, Yung-Chun; Chang, Yu-Ming; Chang, Yu-Ming;Li, Yung-Chun;Chang, Yuan-Hao;Kuo, Tei-Wei;Hsieh, Chih-Chang;Li, Hsiang-Pang; TEI-WEI KUO; Li, Hsiang-Pang; Hsieh, Chih-Chang; Kuo, Tei-Wei |
| 臺大學術典藏 |
2013 |
A disturb-alleviation scheme for 3D flash memory.
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Li, Yung-Chun; TEI-WEI KUO; Chang, Yu-Ming;Chang, Yuan-Hao;Kuo, Tei-Wei;Li, Hsiang-Pang;Li, Yung-Chun; Chang, Yu-Ming; Chang, Yuan-Hao; Kuo, Tei-Wei; Li, Hsiang-Pang |
| 臺大學術典藏 |
2013 |
A disturb-alleviation scheme for 3D flash memory.
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Li, Yung-Chun; TEI-WEI KUO; Chang, Yu-Ming;Chang, Yuan-Hao;Kuo, Tei-Wei;Li, Hsiang-Pang;Li, Yung-Chun; Chang, Yu-Ming; Chang, Yuan-Hao; Kuo, Tei-Wei; Li, Hsiang-Pang |
Showing items 1-7 of 7 (1 Page(s) Totally)
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