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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2020-05-04T08:06:34Z Data compression and query for large scale sensor data on COTS DBMS TEI-WEI KUO; Liang, M.-S.; Shih, C.-S.; Kuo, T.-W.; Luoh, R.-S.; Kuo, C.-W.; Suei, P.-L.;Kuo, C.-W.;Luoh, R.-S.;Kuo, T.-W.;Shih, C.-S.;Liang, M.-S.; Suei, P.-L.
臺大學術典藏 2020-01-13T08:22:41Z Digital communication using Ge metal-insulator-semiconductor light-emitting diodes and photodetectors Cheng, T.-H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; Liu, C.W.; MING-HAN LIAO
臺大學術典藏 2020-01-13T08:22:40Z Gate width dependence on backscattering characteristics in the nanoscale strained complementary metal-oxide-semiconductor field-effect transistor Liao, M.H.; Liu, C.W.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; MING-HAN LIAO
臺大學術典藏 2020-01-13T08:22:40Z 2.0 μm electroluminescence from Si/ Si0.2 Ge0.8 type II heterojunctions Liao, M.H.; Cheng, T.-H.; Liu, C.W.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; MING-HAN LIAO
臺大學術典藏 2020-01-06T03:08:10Z Absorption of ethanol into water and glycerol/water solution in a rotating packed bed Chiang, C.-Y.; Chen, Y.-S.; Liang, M.-S.; Lin, F.-Y.; Tai, C.Y.-D.; Liu, H.-S.; HWAI-SHEN LIU
臺大學術典藏 2020-01-06T03:08:08Z Biodegradation of n-alkanes at high concentration and correlation to the accumulation of H + ions in Rhodococcus erythropolis NTU-1 Liu, C.-W.; Liang, M.-S.; Chen, Y.-C.; Sayavedra-Soto, L.A.; Liu, H.-S.; HWAI-SHEN LIU
臺大學術典藏 2019-03-11T08:01:04Z The dependence of the performance of strained NMOSFETs on channel width Liang, M.S.;Lee, T.L.;Liu, C.W.;Lee, J.Y.-M.;Wu, J.;Chen, C.H.;Yeh, L.;Liao, M.H.; Yeh, L.; Liao, M.H.; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; Liang, M.S.
臺大學術典藏 2019-03-11T08:01:01Z Superior n-MOSFET performance by optimal stress design Liang, M.-S.;Liu, C.W.;Lee, T.-L.;Yeh, L.;Liao, M.H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liang, M.-S.
臺大學術典藏 2018-09-10T08:14:39Z Data compression and query for large scale sensor data on COTS DBMS Shih, C.-S.; Liang, M.-S.; CHI-SHENG SHIH; Suei, P.-L.;Kuo, C.-W.;Luoh, R.-S.;Kuo, T.-W.;Shih, C.-S.;Liang, M.-S.; Suei, P.-L.; Kuo, C.-W.; Luoh, R.-S.; Kuo, T.-W.
臺大學術典藏 2018-09-10T07:37:16Z The dependence of the performance of strained NMOSFETs on channel width Yeh, L.;Liao, M.H.;Chen, C.H.;Wu, J.;Lee, J.Y.-M.;Liu, C.W.;Lee, T.L.;Liang, M.S.; Yeh, L.; Liao, M.H.; Chen, C.H.; Wu, J.; Lee, J.Y.-M.; Liu, C.W.; Lee, T.L.; Liang, M.S.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T07:04:11Z Digital communication using Ge metal-insulator-semiconductor light-emitting diodes and photodetectors Cheng, T.-H.; Liao, M.H.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; Liu, C.W.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T07:04:10Z Gate width dependence on backscattering characteristics in the nanoscale strained complementary metal-oxide-semiconductor field-effect transistor Liao, M.H.; Liu, C.W.; Yeh, L.; Lee, T.-L.; Liang, M.-S.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T07:04:08Z Superior n-MOSFET performance by optimal stress design Liao, M.H.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liang, M.-S.; CHEE-WEE LIU
臺大學術典藏 2018-09-10T06:31:20Z Superior n-MOSFET performance by optimal stress design CHEE-WEE LIU; Liang, M.-S.; Yeh, L.; Lee, T.-L.; Liu, C.W.; Liao, M.H.; Yang, Y.-J.
國立交通大學 2017-04-21T06:48:24Z High temperature stable [Ir3Si-TaN]/HfLaON CMOS with large work-function difference Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Chen, W. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.
國立交通大學 2017-04-21T06:48:24Z Relaxation-free strained SiGe with super anneal for 32nm high performance PMOS and beyond Yu, Ming H.; Li, J. H.; Lin, H. H.; Chen, C. H.; Ku, K. C.; Nieh, C. F.; Hisa, H.; Sheu, Y. M.; Tsai, C. W.; Wang, Y. L.; Chu, H. Y.; Cheng, H. C.; Lee, T. L.; Chen, S. C.; Liang, M. S.
國立交通大學 2014-12-08T15:44:11Z Mechanical properties and fracture mechanism of porous SiOCH low-k dielectrics Chang, H. L.; Kuo, C. T.; Liang, M. S.
國立交通大學 2014-12-08T15:15:52Z HfSiON n-MOSFETs using low-work function HfSi chi gate Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.
國立交通大學 2014-12-08T15:14:22Z High-temperature stable HfLaON p-MOSFETs with high-work-function Ir3Si gate Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S.
國立交通大學 2014-12-08T15:08:20Z The Dependence of the Performance of Strained NMOSFETs on Channel Width Yeh, Lingyen; Liao, Ming Han; Chen, Chun Heng; Wu, Jun; Lee, Joseph Ya-Min; Liu, Chee Wee; Lee, T. L.; Liang, M. S.
國立交通大學 2014-12-08T15:06:33Z Oxygen vacancy estimation of high k metal gate using thermal dynamic model Chang, H. L.; Liang, M. S.
國立成功大學 2009-08 The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs Cheng, C. Y.; Fang, Yean-Kuen; Liao, J. C.; Wang, T. J.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-11-10 The influence of nitrogen incorporation on performance and bias temperature instability of metal oxide semiconductor field effect transistors with ultrathin high-k gate stacks Liao, Jia-Ching; Fang, Yean-Kuen; Chen, C. H.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-09-01 Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學 2008-05 Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.

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