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| 國立成功大學 |
2021-06-10 |
消費者參與共同創造綠色產品之顧客價值影響因素研究
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廖嘉淳; Liao, Chia-Chun |
| 國立交通大學 |
2014-12-12T01:30:17Z |
氮化矽的氫與其應力對電晶體之影響
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廖家駿; Liao, Chia-Chun; 趙天生; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:48:37Z |
Characteristics of SONOS-Type Flash Memory With In Situ Embedded Silicon Nanocrystals
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Chiang, Tsung-Yu; Wu, Yi-Hong; Ma, William Cheng-Yu; Kuo, Po-Yi; Wang, Kuan-Ti; Liao, Chia-Chun; Yeh, Chi-Ruei; Yang, Wen-Luh; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:38:10Z |
Impact of Strain Layer on Gate Leakage and Interface-State for nMOSFETs Fabricated by Stress-Memorization Technique
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Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:28:22Z |
Novel 2-Bit/Cell Wrapped-Select-Gate SONOS TFT Memory Using Source-Side Injection for NOR-Type Flash Array
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Wang, Kuan-Ti; Hsueh, Fang-Chang; Lu, Yu-Lun; Chiang, Tsung-Yu; Wu, Yi-Hong; Liao, Chia-Chun; Yen, Li-Chen; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:23:48Z |
Reliability Analysis of Symmetric Vertical-Channel Nickel-Salicided Poly-Si Thin-Film Transistors
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Wu, Yi-Hong; Lin, Je-Wei; Lu, Yi-Hsien; Kuo, Rou-Han; Yen, Li-Chen; Chen, Yi-Hsuan; Liao, Chia-Chun; Kuo, Po-Yi; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:23:12Z |
Hydrogen Instability Induced by Postannealing on Poly-Si TFTs
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Liao, Chia-Chun; Lin, Min-Chen; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:21:25Z |
Impacts of the Underlying Insulating Layers on the MILC Growth Length and Electrical Characteristics
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Liao, Chia-Chun; Lin, Min-Chen; Liu, Shao-Xuan; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:20:40Z |
Effects of Channel Width and Nitride Passivation Layer on Electrical Characteristics of Polysilicon Thin-Film Transistors
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Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:08:49Z |
MILC-TFT With High-kappa Dielectrics for One-Time-Programmable Memory Application
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Chiang, Tsung-Yu; Ma, Ming-Wen; Wu, Yi-Hong; Kuo, Po-Yi; Wang, Kuan-Ti; Liao, Chia-Chun; Yeh, Chi-Ruei; Chao, Tien-Sheng |
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