|
"liao j c"的相关文件
显示项目 31-40 / 43 (共5页)
<< < 1 2 3 4 5 > >>
每页显示[10|25|50]项目
| 國立臺灣海洋大學 |
2013 |
Failure Investigation of a Drilled Shaft Stabilized Slope
|
Liao, J.C;Lin, S.S;Yang, S.D |
| 國立臺灣海洋大學 |
2012 |
Effects of Scouring on Performance of Caisson Foundation
|
Lin, S.S;Hsu, S.Y;Liao, J.C;Lin, J.G |
| 國立成功大學 |
2011-12 |
Foot Pressure and Center of Pressure in Athletes with Ankle Instability during Lateral Shuffling and Running Gait
|
Huang, P.-Y.;Lin, C.-F.;Kuo, L.-C.;Liao, J.-C. |
| 國立成功大學 |
2009-08 |
The effects of STI induced mechanical strain on GIDL current in Hf-based and SiON MOSFETs
|
Cheng, C. Y.; Fang, Yean-Kuen; Liao, J. C.; Wang, T. J.; Hou, Y. T.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立臺灣大學 |
2009-05 |
Characterization of nonlinear absorption of InN epitaxial films
|
Tsai, T. R.; Wu, T. H.; Liao, J. C.; Wei, T. H.; Chiang, H. P.; Hwang, J. S.; Tsai, D. P.; Chen, Y. F. |
| 國立臺灣大學 |
2009-03 |
Characterization of nonlinear absorption of InN epitaxial films with femtosecond pulsed transmission Z-scan measurements
|
Tsai, T.R.; Wu, T.H.; Liao, J.C.; Wei, T.H.; Chiang, H.P.; Hwang, J.S.; Tsai, D.P.; Chen, Y.F. |
| 臺大學術典藏 |
2009 |
Nonlinear absorption of InN epitaxial films probed by femtosecond pulsed transmission Z-scan measurements
|
Tsai, T.-R.;Wu, T.-H.;Liao, J.-C.;Wei, T.-H.;Chiang, H.-P.;Hwang, J.-S.;Tsai, D.-P.;Chen, Y.-F.; Tsai, T.-R.; Wu, T.-H.; Liao, J.-C.; Wei, T.-H.; Chiang, H.-P.; Hwang, J.-S.; Tsai, D.-P.; Chen, Y.-F.; YANG-FANG CHEN |
| 國立成功大學 |
2008-09-01 |
Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks
|
Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-05 |
Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors
|
Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y. |
| 國立成功大學 |
2008-04-30 |
Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique
|
Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Wu, W. H.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
显示项目 31-40 / 43 (共5页)
<< < 1 2 3 4 5 > >>
每页显示[10|25|50]项目
|
