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Showing items 31-40 of 58  (6 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:09:02Z Photolithography Control in Wafer Fabrication Based on Process Capability Indices With Multiple Characteristics Pearn, W. L.; Kang, H. Y.; Lee, A. H. -I.; Liao, M. Y.
國立臺灣科技大學 2014 Fuzzy estimation for process loss assessment Wu, C.-W.;Chang, Y.-C.;Liao, M.-Y.
國立臺灣大學 2013-04 Surface States Mediated NIR Two-Photon Fluorescence of Iron Oxides for Nonlinear Optical Microscopy Liao, M.-Y.; Wu, C.-H.; Lai, P.-S.; Yu, J.; Lin, H.-P.; Liu, T.-M.; Huang, C.-C.
國立臺灣科技大學 2013 Efficient methods for comparing two process yields - Strategies on supplier selection Wu, C.-W.;Liao, M.-Y.;Yang, T.-T.
國立臺灣科技大學 2013 Fuzzy inference to supplier evaluation and selection based on quality index: A flexible approach Liao, M.-Y.;Wu, C.-W.;Wu, J.-W.
國立臺灣科技大學 2012 Generalized inference for measuring process yield with the contamination of measurement errors-quality control for silicon wafer manufacturing processes in the semiconductor industry Wu, C.-W.;Liao, M.-Y.
國立臺灣科技大學 2012 An improved approach for constructing lower confidence bound on process yield Wu, C.-W.;Liao, M.-Y.;Chen, J.C.
臺大學術典藏 2012 Epithelial cell adhesion molecule regulates tumor initiation and tumorigenesis via activating reprogramming factors and epithelial-mesenchymal transition gene expression in colon cancer Lin, C.-W.;Liao, M.-Y.;Lin, W.-W.;Wang, Y.-P.;Lu, T.-Y.;Wu, H.-C.; YI-PING WANG
國立臺灣科技大學 2011 Two Tests for Supplier Selection Based on Process Yield Pearn, W.L.;Liao, M.Y.;Wu, C.W.;Chu, Y.T.
國立臺灣科技大學 2010 Evaluating process performance based on the incapability index for measurements with uncertainty Liao, M. Y. ; Wu, Chien-Wei

Showing items 31-40 of 58  (6 Page(s) Totally)
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