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Institution	Date	Title	Author
國立臺灣大學	2008	Shallow-Trench-Isolation (STI)-Induced Mechanical-Stress-Related Kink-Effect Behaviors of 40-nm PD SOI NMOS Device	Su, V. C.; Kuo, James B.; Lin, I. S.; Lin, Guan-Shyan; Chen, David C.; Yeh, Chune-Sin; Tsai, Cheng-Tzung; Ma, Mike

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