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Institution Date Title Author
臺大學術典藏 2022-04-21T23:17:28Z Local-Oxide-Thinning-Induced Deep Depletion Phenomenon in MOS Capacitors Lin, Kuan Wun; JENN-GWO HWU
臺大學術典藏 2022-03-22T15:04:54Z An Analytical Model for the Electrostatics of Reverse-Biased Al/SiO₂/Si(p) MOS Capacitors With Tunneling Oxide Lin, Kuan Wun; Chen, Kung Chu; JENN-GWO HWU
臺大學術典藏 2022-01-22T00:04:15Z Role of Schottky barrier height modulation on the reverse bias current behavior of MIS(P) tunnel diodes Chen, Kung Chu; Lin, Kuan Wun; JENN-GWO HWU

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