|
English
|
正體中文
|
简体中文
|
2815035
|
|
???header.visitor??? :
27380018
???header.onlineuser??? :
522
???header.sponsordeclaration???
|
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"lin kun yao"???jsp.browse.items-by-author.description???
Showing items 1-3 of 3 (1 Page(s) Totally)
1
View [10|25|50] records per page
| 國立成功大學 |
2014-12-01 |
Anomalous degradation behaviors under illuminated gate bias stress in a-Si:H thin film transistor
|
Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Lin, Kun-Yao; Wu, Yi-Chun; Huang, Shih-Feng; Chiang, Cheng-Lung; Chen, Po-Lin; Lai, Tzu-Chieh; Lo, Chang-Cheng; Lien, Alan |
| 國立成功大學 |
2013-09-30 |
Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor
|
Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Chen, Te-Chih; Hsieh, Tien-Yu; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-07-01 |
High temperature-induced abnormal suppression of sub-threshold swing and on-current degradations under hot-carrier stress in a-InGaZnO thin film transistors
|
Tsai, Ming-Yen; Chang, Ting-Chang; Chu, Ann-Kuo; Hsieh, Tien-Yu; Chen, Te-Chih; Lin, Kun-Yao; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
Showing items 1-3 of 3 (1 Page(s) Totally)
1
View [10|25|50] records per page
|
