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| 臺大學術典藏 |
2020-06-11T06:11:15Z |
Automatic test pattern generation for delay defects using timed characteristic functions.
|
Ho, Shin-Yann;Lin, Shuo-Ren;Yuan, Ko-Lung;Kuo, Chien-Yen;Liao, Kuan-Yu;Jiang, Jie-Hong R.;Li, Chien-Mo James; Ho, Shin-Yann; Lin, Shuo-Ren; Yuan, Ko-Lung; Kuo, Chien-Yen; Liao, Kuan-Yu; Jiang, Jie-Hong R.; Li, Chien-Mo James; JIE-HONG JIANG |
| 臺大學術典藏 |
2020-06-11T06:11:15Z |
Automatic test pattern generation for delay defects using timed characteristic functions.
|
Ho, Shin-Yann;Lin, Shuo-Ren;Yuan, Ko-Lung;Kuo, Chien-Yen;Liao, Kuan-Yu;Jiang, Jie-Hong R.;Li, Chien-Mo James; Ho, Shin-Yann; Lin, Shuo-Ren; Yuan, Ko-Lung; Kuo, Chien-Yen; Liao, Kuan-Yu; Jiang, Jie-Hong R.; Li, Chien-Mo James; JIE-HONG JIANG |
Showing items 1-2 of 2 (1 Page(s) Totally)
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