|
English
|
正體中文
|
简体中文
|
2825920
|
|
???header.visitor??? :
31400291
???header.onlineuser??? :
1230
???header.sponsordeclaration???
|
|
|
???tair.name??? >
???browser.page.title.author???
|
"liou ft"???jsp.browse.items-by-author.description???
Showing items 1-1 of 1 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:26:32Z |
A novel and direct determination of the interface traps in sub-100nm CMOS devices with direct tunneling regime (12 similar to 16A) gate oxide
|
Chung, SS; Chen, SJ; Yang, CK; Cheng, SM; Lin, SH; Sheng, YC; Lin, HS; Hung, KT; Wu, DY; Yew, TR; Chien, SC; Liou, FT; Wen, F |
Showing items 1-1 of 1 (1 Page(s) Totally) 1 View [10|25|50] records per page
|