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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2017-04-21T06:48:54Z |
Failure Analysis of Gate-all-around Nanowire Field Effect Transistor Under TLP Test
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Zhang, Guoyan; Dong, Aihua; Liu, Nie; Tian, Rui; Yang, Xuejiao; Liu, Zhiwei; Lee, Kohui; Lin, Horng-Chih; Liou, Juin J.; Wang Yuxin |
國立交通大學 |
2014-12-08T15:08:53Z |
Electrostatic Discharge Robustness of Si Nanowire Field-Effect Transistors
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Liu, Wen; Liou, Juin J.; Chung, Andy; Jeong, Yoon-Ha; Chen, Wei-Chen; Lin, Horng-Chih |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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