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Institution Date Title Author
國立交通大學 2020-02-02T23:55:33Z Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Lu, Chun-Chang; Ku, S. H.; Chang, Y. W.; Wu, Guan-Wei; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan
國立交通大學 2019-05-02T00:25:50Z Grain Boundary Trap-Induced Current Transient in a 3-D NAND Flash Cell String Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Ku, S. H.; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan
國立交通大學 2018-08-21T05:56:39Z Polycrystalline-Silicon Channel Trap Induced Transient Read Instability in a 3D NAND Flash Cell String Tsai, Wen-Jer; Lin, W. L.; Cheng, C. C.; Ku, S. H.; Chou, Y. L.; Liu, Lenvis; Hwang, S. W.; Lu, T. C.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan
國立交通大學 2017-04-21T06:55:39Z Poly-Silicon Trap Position and Pass Voltage Effects on RTN Amplitude in a Vertical NAND Flash Cell String Chou, Y. L.; Wang, Tahui; Lin, Mercator; Chang, Y. W.; Liu, Lenvis; Huang, S. W.; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan
國立交通大學 2017-04-21T06:48:16Z Investigation of charge loss in cycled NBit cells via field and temperature accelerations Tsai, W. J.; Zous, N. K.; Chen, H. Y.; Liu, Lenvis; Yeh, C. C.; Chen, Sam; Lu, W. P.; Wang, Tahui; Ku, Joseph; Lu, Chih-Yuan

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