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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立交通大學 |
2020-03-02T03:23:28Z |
Reliability of Atmosphere Pressure-Plasma Enhanced Chemical Vapor Deposition Deposited Indium Gallium Zinc Oxide Resistive Random Access Memory Device with Microwave Annealing
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Wu, Chien-Hung; Kuo, Song-Nian; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Xu, Ni; Liu, Wu-Yang; Chin, Albert |
| 國立交通大學 |
2020-03-02T03:23:28Z |
Investigation of Microwave Annealing on Resistive Random Access Memory Device with Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition Deposited IGZO Layer
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Wu, Chien-Hung; Kuo, Song-Nian; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Xu, Ni; Liu, Wu-Yang; Chin, Albert |
| 國立交通大學 |
2015-11-26T01:02:22Z |
微波退火對大氣電漿沉積氧化銦鎵鋅層於電阻式記憶體元件之影響
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劉午陽; Liu, Wu-Yang; 張國明; Kow-Ming Chang |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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