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Institution Date Title Author
國立成功大學 2005-08 Damages and microstructural variation of high-lead and eutectic SnPb composite flip chip solder bumps induced by electromigration Liu, Yeh-Hsiu; Lin, Kwang-Lung
國立成功大學 2005-07-15 高鉛與共晶錫鉛複合銲錫隆點與底層金屬之界面反應及電遷移行為 劉業繡; Liu, Yeh-Hsiu
國立成功大學 2005-07-15 高鉛與共晶錫鉛複合銲錫隆點與底層金屬之界面反應及電遷移行為 劉業繡; Liu, Yeh-Hsiu
國立成功大學 2004-08 Failure behavior upon shear test of 5Sn-95Pb solder bump after high temperature reliability test Liu, Yeh-Hsiu; Chuang, Chiang-Ming; Lin, Kwang-Lung
國立成功大學 2003-08-01 The cathode current efficiency of flip-chip solder bump plating Lin, Kwang-Lung; Liu, Yeh-Hsiu

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