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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2014 Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen

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