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Showing items 36-45 of 50  (5 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:13:29Z Nonvolatile memory characteristics of nickel-silicon-nitride nanocrystal Chen, Wei-Ren; Chang, Ting-Chang; Liu, Po-Tsun; Yeh, Jui-Lung; Tu, Chun-Hao; Lou, Jen-Chung; Yeh, Ching-Fa; Chang, Chun-Yen
國立交通大學 2014-12-08T15:11:58Z Improved Retention Characteristic in Polycrystalline Silicon-Oxide-Hafnium Oxide-Oxide-Silicon-Type Nonvolatile Memory with Robust Tunnel Oxynitride Hsieh, Chih Ren; Lai, Chiung Hui; Lin, Bo Chun; Zheng, Yuan Kai; Lou, Jen Chung; Lin, Gray
國立交通大學 2014-12-08T15:11:31Z Effect of interfacial fluorination on the electrical properties of the inter-poly high-k dielectrics Hsieh, Chih-Ren; Chen, Yung-Yu; Lu, Kwung-Wen; Lin, Gray; Lou, Jen-Chung
國立交通大學 2014-12-08T15:10:44Z UV Illumination Technique for Leakage Current Reduction in a-Si:H Thin-Film Transistors Li, Yiming; Hwang, Chih-Hong; Chen, Chung-Le; Yan, Shuoting; Lou, Jen-Chung
國立交通大學 2014-12-08T15:07:35Z Improved performance and reliability for metal-oxide-semiconductor field-effect-transistor with fluorinated silicate glass passivation layer Hsieh, Chih-Ren; Chen, Yung-Yu; Lou, Jen-Chung
國立交通大學 2014-12-08T15:07:35Z Effect of UV illumination on inverted-staggered a-Si : H thin film transistors Li, Yiming; Lou, Jen-Chung; Chen, Chung-Le; Hwang, Chih-Hong; Yan, Shuoting
國立交通大學 2014-12-08T15:05:33Z Improvements of ozone surface treatment on the electrical characteristics and reliability in HfO2 gate stacks Chen, Shih-Chang; Chen, Yung-Yu; Chang, Yu-Tzu; Lou, Jen-Chung; Kin, Kon-Tsu; Chien, Chao-Hsin
國立交通大學 2014-12-08T15:01:25Z Impact of Charge Trapping Effect on Negative Bias Temperature Instability in P-MOSFETs with HfO(2)/SiON Gate Stack Chen, Shih-Chang; Chien, Chao-Hsin; Lou, Jen-Chung
國立成功大學 2014-06 Characterization of Oxygen Accumulation in Indium-Tin-Oxide for Resistance Random Access Memory Zhang, Rui; Chang, Kuan-Chang; Chang, Ting-Chang; Tsai, Tsung-Ming; Huang, Syuan-Yong; Chen, Wen-Jen; Chen, Kai-Huang; Lou, Jen-Chung; Chen, Jung-Hui; Young, Tai-Fa; Chen, Min-Chen; Chen, Hsin-Lu; Liang, Shu-Ping; Syu, Yong-En; Sze, Simon M.
國立成功大學 2014-02 Tri-Resistive Switching Behavior of Hydrogen Induced Resistance Random Access Memory Chu, Tian-Jian; Tsai, Tsung-Ming; Chang, Ting-Chang; Chang, Kuan-Chang; Zhang, Rui; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Huang, Jen-Wei; Lou, Jen-Chung; Chen, Min-Chen; Huang, Syuan-Yong; Chen, Hsin-Lu; Syu, Yong-En; Bao, Dinghua; Sze, Simon M.

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