|
|
???tair.name??? >
???browser.page.title.author???
|
"lu chih yuan"???jsp.browse.items-by-author.description???
Showing items 21-30 of 53 (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page
| 國立交通大學 |
2017-04-21T06:56:07Z |
Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory
|
Liu, Yu-Heng; Jiang, Cheng-Min; Chen, Wei-Chun; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:55:58Z |
A Novel Varying-Bias Read Scheme for MLC and Wide Temperature Range TMO ReRAM
|
Lin, Yu-Hsuan; Lee, Ming-Hsiu; Wu, Jau-Yi; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Chiang, Kuang-Hao; Lai, Erh-Kun; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:55:39Z |
Poly-Silicon Trap Position and Pass Voltage Effects on RTN Amplitude in a Vertical NAND Flash Cell String
|
Chou, Y. L.; Wang, Tahui; Lin, Mercator; Chang, Y. W.; Liu, Lenvis; Huang, S. W.; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:40Z |
STUDY OF GATE-INJECTION OPERATED SONOS-TYPE DEVICES USING THE GATE-SENSING AND CHANNEL-SENSING (GSCS) METHOD
|
Du, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Huang, Tiao-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:40Z |
MULTI-LEVEL OPERATION OF FULLY CMOS COMPATIBLE WOX RESISTIVE RANDOM ACCESS MEMORY (RRAM)
|
Chien, W. C.; Chen, Y. C.; Chang, K. P.; Lai, E. K.; Yao, Y. D.; Lin, P.; Gong, J.; Tsai, S. C.; Hsieh, S. H.; Chen, C. F.; Hsieh, K. Y.; Liu, R.; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Reliability Study of MANOS with and without a SiO2 Buffer Layer and BE-MANOS Charge-Trapping NAND Flash Devices
|
Liao, Chien-Wei; Lai, Sheng-Chih; Lue, Hang-Ting; Yang, Ming-Jui; Shen, Chin-Yen; Lue, Yi-Hsien; Huang, Yu-Fong; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:25Z |
Excellent Resistance Variability Control of WOx ReRAM by a Smart Writing Algorithm
|
Lin, Yu-Hsuan; Wu, Jau-Yi; Lee, Ming-Hsiu; Wang, Tien-Yen; Lin, Yu-Yu; Lee, Feng-Ming; Lee, Dai-Ying; Lai, Erh-Kun; Chiang, Kuang-Hao; Lung, Hsiang-Lan; Hsieh, Kuang-Yeu; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:17Z |
A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance
|
Lo, Roger; Du, Pei-Ying; Hsu, Tzu-Hsuan; Wu, Chen-Jun; Guo, Jung-Yi; Cheng, Chun-Min; Lue, Hang-Ting; Shih, Yen-Hao; Hou, Tuo-Hung; Hsieh, Kuang-Yeu; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Characterization and Monte Carlo analysis of secondary electrons induced program disturb in a buried diffusion bit-line SONOS flash memory
|
Tang, Chun-Jung; Li, C. W.; Wang, Tahui; Gu, S. H.; Chen, P. C.; Chang, Y. W.; Lu, T. C.; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:49:08Z |
A 2-bit/cell, maskless, self-aligned resistance memory with high thermal stability
|
He, ChiaHua; Lee, Ming-Daou; Pan, Chen-Ling; Lai, Erb-Kun; Yao, Yeong-Der; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
Showing items 21-30 of 53 (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page
|
