|
English
|
正體中文
|
简体中文
|
总笔数 :0
|
|
造访人次 :
51488630
在线人数 :
619
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
"lu ching sen"的相关文件
显示项目 11-16 / 16 (共1页)
1
每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:15:10Z |
Improvement of negative-bias-temperature instability in SiN-capped p-channel metal-oxide-semiconductor field-effect transistors using ultrathin HfO2 buffer layer
|
Lu, Ching-Sen; Horng-Chih, Lin; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:14:29Z |
Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN capping
|
Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:09:26Z |
Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer
|
Lu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:07:33Z |
Optimization of SiN film by varying precursor flow conditions and its impacts on strained channel NMOSFETs
|
Lu, Ching-Sen; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:06:23Z |
Impacts of low-pressure chemical vapor deposition-SiN capping layer and lateral distribution of interface traps on hot-carrier stress of n-channel metal-oxide-semiconductor field-effect-transistors
|
Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lu, Chia-Yu; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立成功大學 |
2014-10-06 |
Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks
|
Tsai, Jyun-Yu; Chang, Ting-Chang; Chen, Ching-En; Ho, Szu-Han; Liu, Kuan-Ju; Lu, Ying-Hsin; Liu, Xi-Wen; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Lu, Ching-Sen |
显示项目 11-16 / 16 (共1页)
1
每页显示[10|25|50]项目
|
