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| 國立交通大學 |
2020-02-02T23:55:33Z |
Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory
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Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Lu, Chun-Chang; Ku, S. H.; Chang, Y. W.; Wu, Guan-Wei; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:48:54Z |
National Project on 45 to 32 nm Metal Oxide Semiconductor Field Effect Transistors for Next Century IC Fabrications
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Hwang, Huey-liang; Wang, C. W.; Chang, K. H.; Tsai, C. H.; Leou, K. C.; Chang-Liao, Kuei-Shu; Lu, Chun-Chang; Chang, S. C.; Chiu, F. C.; Liu, C. H.; Chin, Albert; Chang, Kow-Ming; Chen, Bwo-Ning |
| 國立交通大學 |
2014-12-08T15:05:21Z |
Advance in next Century nanoCMOSFET research
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Hwang, Huey-Liang; Chiou, Yan-Kai; Chang, Che-Hao; Wang, Chen-Chan; Lee, Kun-Yu; Wu, Tai-Bor; Kwo, Raynien; Hong, Minghwei; Chang-Liao, Kuei-Shu; Lu, Chun-Yuan; Lu, Chun-Chang; Chiu, Fu-Chien; Chen, Chun-Heng; Lee, Joseph Ya-Min; Chin, Albert |
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