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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"lu cw"的相關文件
顯示項目 16-25 / 52 (共6頁)
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| 元智大學 |
2015 |
Continuous Monitoring of the Complexity of Intracranial Pressure After Head Injury
|
Lu CW; J.S. Shieh; Pickard JD; Smielewski P |
| 國立交通大學 |
2014-12-08T15:48:46Z |
Direct current circuit simulation model for a field emission triode
|
Lu, CW; Lee, CL |
| 國立交通大學 |
2014-12-08T15:47:36Z |
A physical simulation model for field emission triode
|
Lu, CW; Lee, CL |
| 國立交通大學 |
2014-12-08T15:42:51Z |
Analysis of application of the IDDQ technique to the deep sub-micron VLSI testing
|
Lu, CW; Lee, CL; Su, CC; Chen, JE |
| 國立交通大學 |
2014-12-08T15:42:36Z |
A low-power high-speed class-AB buffer amplifter for flat-panel-display application
|
Lu, CW; Lee, CL |
| 國立交通大學 |
2014-12-08T15:37:24Z |
Experimental and theoretical investigations of rate coefficients of the reaction S(P-3)+O-2 in the temperature range 298-878 K
|
Lu, CW; Wu, YJ; Lee, YP; Zhu, RS; Lin, MC |
| 國立交通大學 |
2014-12-08T15:27:38Z |
A SPICE simulation model for field emission triode
|
Lu, CW; Lee, CL; Huang, JM |
| 國立交通大學 |
2014-12-08T15:27:38Z |
A high speed circuit scheme for driving field emission array
|
Lu, CW; Lee, CL; Huang, JM |
| 國立交通大學 |
2014-12-08T15:27:37Z |
A fast and sensitive built-in current sensor for IDDQ testing
|
Lu, CW; Lee, CL; Chen, JE |
| 國立交通大學 |
2014-12-08T15:27:20Z |
A new IDDQ testing scheme employing charge storage BICS circuit for deep submicron CMOS ULSI
|
Lu, CW; Lee, CL; Chen, JE; Su, CC |
顯示項目 16-25 / 52 (共6頁)
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