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教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
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機構 日期 題名 作者
國立交通大學 2014-12-08T15:37:15Z Fabrication and characteristics of high-speed oxide-confined VCSELs using InGaAsP-InGaP strain-compensated MQWs Chang, YH; Kuo, HC; Lai, FI; Chang, YA; Lu, CY; Laih, LH; Wang, SC
國立交通大學 2014-12-08T15:27:13Z Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's Yeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ
國立交通大學 2014-12-08T15:26:12Z A low noise composite-channel metamorphic HEMT for wireless communication applications Lu, CY; Chen, KS; Lee, HM; Chang, EY; Chen, SH; Lin, YC; Chen, GJ
國立交通大學 2014-12-08T15:25:47Z Investigation of programmed charge lateral spread in a two-bit storage nitride flash memory cell by using a charge pumping technique Gu, SH; Wang, MT; Chan, CT; Zous, NK; Yeh, CC; Tsai, WJ; Lu, TC; Wang, TH; Ku, J; Lu, CY
國立交通大學 2014-12-08T15:19:37Z A novel fully CMOS process compatible PREM for SOC applications Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Liao, YY; Zous, NK; Chin, CY; Chen, YR; Chen, MS; Ting, WC; Lu, CY
國立交通大學 2014-12-08T15:19:29Z A novel PHINES flash memory cell with low power program/erase, small pitch, two-bits-per-cell for data storage applications Yeh, CC; Wang, TH; Tsai, WJ; Lu, TC; Chen, MS; Liao, YY; Ting, WC; Ku, YHJ; Lu, CY
國立交通大學 2014-12-08T15:19:04Z Improving high-temperature performance in continuous-wave mode InGaAsN/GaAsN ridge waveguide lasers Chang, YA; Kuo, HC; Lu, CY; Kuo, YK; Wang, SC
國立交通大學 2014-12-08T15:18:55Z Mechanism for slow switching effect in advanced low-voltage, high-speed Pb(Zr1-XTiX)O-3 ferroelectric memory Tsai, CW; Lai, SC; Yen, CT; Lien, HM; Lung, HL; Wu, TB; Wang, TH; Liu, R; Lu, CY
國立交通大學 2014-12-08T15:17:37Z Characterization of programmed charge lateral distribution in a two-bit storage nitride flash memory cell by using a charge-pumping technique Gu, SH; Wang, TH; Lu, WP; Ting, WC; Ku, YHJ; Lu, CY
國立交通大學 2014-12-08T15:17:35Z Impacts of uniaxial compressive strain on dynamic negative bias temperature instability of p-channel MOSFETs Lu, CY; Lin, HC; Huang, TY

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