|
|
Taiwan Academic Institutional Repository >
Browse by Author
|
"lu s k"
Showing items 1-10 of 70 (7 Page(s) Totally)
1 2 3 4 5 6 7 > >>
View [10|25|50] records per page
| 臺大學術典藏 |
2020-06-11T06:44:36Z |
Integrated heterogeneous infrastructure for indoor positioning
|
Ma, Y.-W.;Chen, J.-L.;Tsai, Y.-H.;Chou, P.-C.;Lu, S.-K.;Kuo, S.-Y.; Ma, Y.-W.; Chen, J.-L.; Tsai, Y.-H.; Chou, P.-C.; Lu, S.-K.; Kuo, S.-Y.; SY-YEN KUO |
| 國立臺灣科技大學 |
2020 |
Temperature Sensing with a Relaxation Oscillator in CMOS ICs
|
Sako, F.;Ikiri, Y.;Hashizume, M.;Yotsuyanagi, H.;Yokoyama, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2020 |
Open Defect Detection Not Utilizing Boundary Scan Flip-Flops in Assembled Circuit Boards
|
Kanda, M.;Hashizume, M.;Ali, F.A.B.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2020 |
Fault-Aware Dependability Enhancement Techniques for Flash Memories
|
Lu, S.-K.;Yu, S.-C.;Hsu, C.-L.;Sun, C.-T.;Hashizume, M.;Yotsuyanagi, H. |
| 國立臺灣科技大學 |
2020 |
Temperature Sensing with a Relaxation Oscillator in CMOS ICs
|
Sako, F.;Ikiri, Y.;Hashizume, M.;Yotsuyanagi, H.;Yokoyama, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2019 |
Resistive open defect detection in SoCs by a test method based on injected charge volume after test input application
|
Matsumoto, Y.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2019 |
Stand-by mode test method of interconnects between dies in 3d ICs with IEEE 1149.1 test circuits
|
Kanda, M.;Yabui, D.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2019 |
Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM
|
Lu, S.-K.;Huang, Huang H.-K.;Hsu, C.-L.;Sun, C.-T.;Miyase, K. |
| 國立臺灣科技大學 |
2019 |
A fault-tolerant MPSoC for CubeSats
|
Fuchs, C.M.;Chou, P.;Wen, X.;Murillo, N.M.;Furano, G.;Holst, S.;Tavoularis, A.;Lu, S.-K.;Plaat, A.;Marinis, K. |
| 國立臺灣科技大學 |
2019 |
A static method for analyzing hotspot distribution on the LSI
|
Miyase, K.;Kawano, Y.;Lu, S.-K.;Wen, X.;Kajihara, S. |
Showing items 1-10 of 70 (7 Page(s) Totally)
1 2 3 4 5 6 7 > >>
View [10|25|50] records per page
|
