臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Showing items 36-45 of 70 (7 Page(s) Totally)
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Institution	Date	Title	Author
國立臺灣科技大學	2016	Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories	Lu, S.-K;Zhong, S.-X;Hashizume, M.
國立臺灣科技大學	2016	An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories	Lu, S.-K;Lin, H.-W;Hashizume, M.
國立臺灣科技大學	2015	Address scrambling and data inversion techniques for yield enhancement of NROM-Based ROMs	Lu, S.-K.;Li, T.-L.;Hashizume, M.;Chen, J.-L.
國立臺灣科技大學	2015	Electrical interconnect test method of 3D ICs by injected charge volume	Suga, D.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K.
國立臺灣科技大學	2015	Hybrid scrambling technique for increasing the fabrication yield of NROM-Based ROMs	Lu, S.-K.;Lin, S.-L.;Lin, H.-W.;Hashizume, M.
國立臺灣科技大學	2015	Electrical interconnect test of 3D ICs made of dies without ESD protection circuits with a built-in test circuit	Nanbara, K.;Odoriba, A.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K.
國立臺灣科技大學	2015	A testable design for electrical interconnect tests of 3D ICs	Odoriba, A.;Umezu, S.;Hashizume, M.;Yotsuyanagi, H.;Ali, F.A.B.;Lu, S.-K.
國立臺灣科技大學	2015	An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories	Lu, S.-K;Lin, H.-W;Hashizume, M.
國立臺灣科技大學	2015	Electrical interconnect test method of 3D ICs without boundary scan flip flops	Hashizume, M;Umezu, S;Ikiri, Y;Ali, F.A.B;Yotsuyanagi, H;Lu, S.-K.
國立臺灣科技大學	2014	A power saving mechanism for multimedia streaming services in cloud computing	Ma, Y.-W.;Chen, J.-L.;Chou, C.-H.;Lu, S.-K.

Showing items 36-45 of 70 (7 Page(s) Totally)
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