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Showing items 26-50 of 70 (3 Page(s) Totally)
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| 國立臺灣科技大學 |
2016 |
A Framework for Third Party Android Marketplaces to Identify Repackaged Apps
|
Lo, N.-W;Lu, S.-K;Chuang, Y.-H. |
| 國立臺灣科技大學 |
2016 |
Integrated heterogeneous infrastructure for indoor positioning
|
Ma, Y.-W;Chen, J.-L;Tsai, Y.-H;Chou, P.-C;Lu, S.-K;Kuo, S.-Y. |
| 國立臺灣科技大學 |
2016 |
Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded Memories
|
Lu, S.-K;Tsai, C.-J;Hashizume, M. |
| 國立臺灣科技大學 |
2016 |
A built-in electrical test circuit for detecting open leads in assembled PCB circuits
|
Miyabe, T;Hashizume, M;Yotsuyanagi, H;Lu, S.-K;Roth, Z. |
| 國立臺灣科技大學 |
2016 |
Electrical interconnect test of solder joint part with boundary scan flip flops and a built-in test circuit
|
Hashizume, M;Ikiri, Y;Konishi, T;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories
|
Lu, S.-K;Tsai, C.-J;Hashizume, M. |
| 國立臺灣科技大學 |
2016 |
A built-in test circuit for electrical interconnect testing of open defects in assembled PCBs
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Widiant, Hashizume M;Suenaga, Suenaga S;Yotsuyanagi, H;Ono, A;Lu, S.-K;Roth, Z. |
| 國立臺灣科技大學 |
2016 |
A power supply circuit for interconnect tests based on injected charge volume of 3D IC
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Ohtani, K;Hashizume, M;Suga, D;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
A built-in defective level monitor of resistive open defects in 3D ICs with logic gates
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Hashizume, M;Odoriba, A;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Testability for resistive open defects by electrical interconnect test of 3D ICs without boundary scan flip flops
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Ali, F.A.B;Hashizume, M;Ikiri, Y;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2016 |
Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories
|
Lu, S.-K;Zhong, S.-X;Hashizume, M. |
| 國立臺灣科技大學 |
2016 |
An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories
|
Lu, S.-K;Lin, H.-W;Hashizume, M. |
| 國立臺灣科技大學 |
2015 |
Address scrambling and data inversion techniques for yield enhancement of NROM-Based ROMs
|
Lu, S.-K.;Li, T.-L.;Hashizume, M.;Chen, J.-L. |
| 國立臺灣科技大學 |
2015 |
Electrical interconnect test method of 3D ICs by injected charge volume
|
Suga, D.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2015 |
Hybrid scrambling technique for increasing the fabrication yield of NROM-Based ROMs
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Lu, S.-K.;Lin, S.-L.;Lin, H.-W.;Hashizume, M. |
| 國立臺灣科技大學 |
2015 |
Electrical interconnect test of 3D ICs made of dies without ESD protection circuits with a built-in test circuit
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Nanbara, K.;Odoriba, A.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2015 |
A testable design for electrical interconnect tests of 3D ICs
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Odoriba, A.;Umezu, S.;Hashizume, M.;Yotsuyanagi, H.;Ali, F.A.B.;Lu, S.-K. |
| 國立臺灣科技大學 |
2015 |
An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories
|
Lu, S.-K;Lin, H.-W;Hashizume, M. |
| 國立臺灣科技大學 |
2015 |
Electrical interconnect test method of 3D ICs without boundary scan flip flops
|
Hashizume, M;Umezu, S;Ikiri, Y;Ali, F.A.B;Yotsuyanagi, H;Lu, S.-K. |
| 國立臺灣科技大學 |
2014 |
A power saving mechanism for multimedia streaming services in cloud computing
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Ma, Y.-W.;Chen, J.-L.;Chou, C.-H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2013 |
Testable design for electrical testing of open defects at interconnects in 3D ICs
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Hashizume, M.;Konishi, T.;Yotsuyanag, H.;Lu, S.-K. |
| 國立臺灣科技大學 |
2013 |
Error-tolerance evaluation and design techniques for motion estimation computing arrays
|
Lu, S.-K.;Chen, M.-C.;Chen, Y.-C. |
| 國立臺灣科技大學 |
2013 |
Efficient test and repair architectures for 3D TSV-based random access memories
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Lu, S.-K.;Lu, U.-C.;Pong, S.-W.;Cheng, H.-C. |
| 國立臺灣科技大學 |
2013 |
Reduction method of number of electromagnetic simulation times for estimating output voltage at hard open TSV in 3D IC
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Haraguchi, E.;Hashizume, M.;Manabe, K.;Yotsuyanagi, H.;Tada, T.;Lu, S.-K.;Roth, Z. |
| 國立臺灣科技大學 |
2013 |
Built-in IDDT appearance time sensor for detecting open faults in 3D IC
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Suenaga, S.;Hashizume, M.;Yotsuyanagi, H.;Tada, T.;Lu, S.-K. |
Showing items 26-50 of 70 (3 Page(s) Totally)
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