臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:30:12Z	Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor	Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng

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