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"lue ht"的相关文件
显示项目 1-12 / 12 (共1页)
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| 國立交通大學 |
2014-12-08T15:45:32Z |
Fermi and anti-Fermi glass transition and subband resonant quantum tunneling in Nb/Ti metallic multilayer films
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Lue, JT; Liang, SY; Lee, YW; Lue, HT |
| 國立交通大學 |
2014-12-08T15:45:11Z |
Photoluminescence and electron paramagnetic resonance studies of defect centers in porous silicon
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Lue, HT; Huang, BY; Lue, JT |
| 國立交通大學 |
2014-12-08T15:43:15Z |
Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin films
|
Lue, HT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:42:52Z |
Addenda to photoluminescence and electron paramagnetic resonance studies of defect centers in porous silicon
|
Lue, HT; Tseng, CY; Lue, JT |
| 國立交通大學 |
2014-12-08T15:42:30Z |
A method to characterize the dielectric and interfacial properties of metal-insulator-semiconductor structures by microwave measurement
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Lue, HT; Tseng, TY; Huang, GW |
| 國立交通大學 |
2014-12-08T15:42:22Z |
Microwave penetration depth measurement for high T-c superconductors by dielectric resonators
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Lue, HT; Lue, JT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:42:00Z |
An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectric
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Lue, HT; Liu, CY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:52Z |
Device modeling of ferroelectric memory field-effect transistor (FeMFET)
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Lue, HT; Wu, CJ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Effects of nitridation of silicon and repeated spike heating on the electrical properties of SrTiO3 gate dielectrics
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Liu, CY; Lue, HT; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:41:26Z |
Device Modeling of ferroelectric memory field-effect transistor for the application of ferroelectric random access memory
|
Lue, HT; Wu, CJ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:38:52Z |
Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin films
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Huang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:26:33Z |
A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement
|
Lue, HT; Tseng, TY; Huang, GW |
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