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Institution Date Title Author
國立交通大學 2014-12-08T15:38:52Z Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin films Huang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY
國立交通大學 2014-12-08T15:26:33Z A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement Lue, HT; Tseng, TY; Huang, GW

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