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Institution	Date	Title	Author
元智大學	Oct-14	A hybrid method for segmented test data compression	Lung-Jen Lee; Wang-Dauh Tseng; Yi-Yu Liu
元智大學	Mar-15	A hybrid method for segmented test data compression	Lung-Jen Lee; Wang-Dauh Tseng; Yi-Yu Liu
元智大學	2013-05-24	Featured Pattern Run Length Coding for Test Data Compression	Lung-Jen Lee; Chih-Ho Shen; Wang-Dauh Tseng
元智大學	2012-12-10	Two-Way Multicasting for Test Data Compression	Lung-Jen Lee; Wang-Dauh Tseng; Wei-Shun Chen
元智大學	2012-12-10	Dual-LFSR Reseeding for Low Power Testing	Lung-Jen Lee; Wang-Dauh Tseng; Wen-Ting Yang
元智大學	2012-12-10	Deterministic ATPG for Low Capture Power Testing	Lung-Jen Lee; Chia-Cheng He; Wang-Dauh Tseng
元智大學	2012-09	Reduction of Test Data Volume and Test Application Time by Scan Chain Disabling Technique	Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學	2012-05-25	Improved Run-Length Codes for Test Data Compression	Lung-Jen Lee; Wang-Dauh Tseng; Ting-Fang Liu
元智大學	2012-04	2(n) Pattern Run-Length for Test Data Compression	Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.; Cheng-Ho Chang
元智大學	2011-12-02	Scan Chain Partitioning for Low Capture Power Testing	Lung-Jen Lee; Zheng-Yi Xie; Wang-Dauh Tseng
元智大學	2011-12-02	Combination of Broadcast Scheme with Scan Tree Architecture for Test Data Compression	Lung-Jen Lee; Wang-Dauh Tseng
元智大學	2011-12-02	A Deterministic ATPG for Low Power Testing	Lung-Jen Lee; Chia-Cheng He ; Wang-Dauh Tseng
元智大學	2011-12	Mismatch address indexing for test data compression	Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學	2011-06	An Internal Pattern Run-Length Methodology for Slice Encoding	Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學	2010-12	Cascaded broadcasting for test data compression	Cheng-Ho Chang; Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學	2010-12	2n Pattern run-length for test data compression	Cheng-Ho Chang; Lung-Jen Lee; Wang-Dauh Tseng; Lin R.-B.
元智大學	2010-07	Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction	曾王道; 林榮彬; Lung-Jen Lee
元智大學	2010-06	Test Data Compression Using Multi-dimensional Pattern Run-length Codes	曾王道; Lung-Jen Lee
元智大學	2010-03	Reduction of Power Dissipation During Scan Testing by Test Vector Ordering	曾王道; 林榮彬; Lung-Jen Lee
元智大學	2009-11	Deterministic Built-in Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing	曾王道; 林榮彬; Lung-Jen Lee; Chi-Wei Y
元智大學	2009-11	Multi-Dimensional Pattern Run-Length Method for Test Data Compression	曾王道; 林榮彬; Lung-Jen Lee; Chen-Lun Lee
元智大學	2009-11	Deterministic Test Pattern Generation using Segmented LFSR	曾王道; 林榮彬; Lung-Jen Lee; You-An Chen
元智大學	2009-11	SOCs Test Scheduling using TAM Switch	曾王道; 林榮彬; Lung-Jen Lee; Zheng-Han Zhan
元智大學	2009-11	Don’t-Care Bits Filling for Capture Power Reduction	曾王道; 林榮彬; Lung-Jen Lee; Zheng-Yi Xie
元智大學	2009-11	An Efficient Method for Test Data Compression based on Internal Pattern Run-length	曾王道; 林榮彬; Lung-Jen Lee; Zheng-Han Zhan

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