| 臺大學術典藏 |
2020-05-12T02:52:12Z |
Suppression of GeO x interfacial layer and enhancement of the electrical performance of the high-K gate stack by the atomic-layer-deposited AlN buffer layer on Ge metal-oxide-semiconductor devices
|
MIIN-JANG CHEN;Chen, M.-J.;Lin, H.-C.;Shyue, J.-J.;Yin, Y.-T.;Wang, C.-Y.;Chang, T.-J.;Wang, C.-I.; Wang, C.-I.; Chang, T.-J.; Wang, C.-Y.; Yin, Y.-T.; Shyue, J.-J.; Lin, H.-C.; Chen, M.-J.; MIIN-JANG CHEN |
| 臺大學術典藏 |
2019-09-09T00:54:20Z |
The effects of annealing and wake-up cycling on the ferroelectricity of zirconium hafnium oxide ultrathin films prepared by remote plasma atomic layer deposition
|
Lin, Bo Ting; MIIN-JANG CHEN; Hsu, Tzu Yao; TZONG-LIN JAY SHIEH; CHIN-LUNG KUO; Lin, Bo Ting;CHIN-LUNG KUO;TZONG-LIN JAY SHIEH;Hsu, Tzu Yao;MIIN-JANG CHEN |
| 臺大學術典藏 |
2019-03-11T08:02:02Z |
Effect of hydrogen participation on the improvement in electrical characteristics of HfO2 gate dielectrics by post-deposition remote N2, N2/H2, and NH3 plasma treatments
|
Miin-Jang Chen;Min-Hung Lee;Hsin-ChihLin;Chin-Lung Kuo;Jhih-Jie Huang;Ming-Lun Chang;Li-Tien Huang;M. H.Liao; M. H.Liao; Li-Tien Huang; Ming-Lun Chang; Jhih-Jie Huang; Chin-Lung Kuo; Hsin-ChihLin; Min-Hung Lee; Miin-Jang Chen |
| 臺大學術典藏 |
2018-09-10T08:46:35Z |
Method For Non-Resist Nanolithography
|
Miin-Jang Chen;Kuen-Yu Tsai;Chee-Wee Liu; Miin-Jang Chen; Kuen-Yu Tsai; Chee-Wee Liu; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:35Z |
Charged-Particle-Beam Patterning Without Resist
|
Kuen-Yu Tsai;Miin-Jang Chen;Samuel C. Pan; Kuen-Yu Tsai; Miin-Jang Chen; Samuel C. Pan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:34Z |
Projection Patterning With Exposure Mask
|
Kuen-Yu Tsai;Miin-Jang Chen;Si-Chen Lee; Kuen-Yu Tsai; Miin-Jang Chen; Si-Chen Lee; KUEN-YU TSAI |
| 中原大學 |
2002 |
The band-edge light emission from the metal-oxide-silicon tunneling diode on (110) substrates
|
S. T. Chang;K. F. Chen;C. R. Shie;C. W. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 中原大學 |
2001-10 |
Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes
|
Miin-Jang Chen;Ching-Fuh Lin;M. H. Lee;S. T. Chang;C. W. Liu |
| 中原大學 |
2001 |
Enhanced reliability of electroluminescence from metal-oxide-silicon tunneling diodes by deuterium incorporation
|
C. W. Liu;C. H. Lin;M. H. Lee;S. T. Chang;Y. H. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 中原大學 |
2001 |
Visible and band edge electroluminescence from indium tin oxide/SiO2/Si metal-oxide-semiconductor structures
|
Miin-Jang Chen;Ching-Fuh Lin;W. T. Liu;S. T. Chang;C. W. Liu |
| 中原大學 |
2000-12 |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
|
C. W. Liu;S. T. Chang;W. T. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 中原大學 |
2000-10 |
Room-Temperature electroluminescence from metal-oxide-silicon tunneling diodes on (110) substrate
|
Chee-Wee Liu;Min-Hung Lee;Shu-Tong Chang;Miin-Jang Chen;Ching-Fuh Lin |
