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机构 日期 题名 作者
義守大學 2009-09 Design of Analog Output Buffer With Level Shifting Function on Glass Substrate for Panel Application Tzu-Ming Wang;Ming-Dou Ker;Sao-Chi Chen
義守大學 2009-08 Transient-Induced Latchup in CMOS Integrated Circuits 柯明道;Ming-Dou Ker; Sheng-Fu Hsu
義守大學 2009-08 Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs Ming-Dou Ker;Cheng-Cheng Yen
義守大學 2009-08 Impact of Gate Leakage on Performances of Phase-Locked Loop Circuit in Nanoscale CMOS Technology Jung-Sheng Chen;Ming-Dou Ker
義守大學 2009-07 Optimization on MOS-Triggered SCR Structures for On-Chip ESD Protection Shih-Hung Chen;Ming-Dou Ker
義守大學 2009-06 Low-capacitance ESD protection design for high-speed I/O interfaces in a 130-nm CMOS process Yuan-Wen Hsiao;Ming-Dou Ker
義守大學 2009-06 Transient-Induced Latchup in CMOS ICs Under Electrical Fast-Transient Test Cheng-Cheng Yen;Ming-Dou Ker;Tung-Yang Chen
義守大學 2009-06 The Effect of IEC-Like Fast Transients on RC-Triggered ESD Power Clamps Cheng-Cheng Yen;Ming-Dou Ker
義守大學 2009-05 Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs Shih-Hung Chen;Ming-Dou Ker
義守大學 2009-05 A 5-GHz Differential Low-Noise Amplifier With High Pin-to-Pin ESD Robustness in a 130-nm CMOS Process Yuan-Wen Hsiao;Ming-Dou Ker
義守大學 2009-05 Design of Mixed-Voltage-Tolerant Crystal Oscillator Circuit in Low-Voltage CMOS Technology Tzu-Ming Wang; Ming-Dou Ker; Hung-Tai Liao
義守大學 2009-04 High-Voltage nLDMOS in Waffle-Layout Style With Body-Injected Technique for ESD Protection Wen-Yi Chen;Ming-Dou Ker
義守大學 2009-03 Impedance-Isolation Technique for ESD Protection Design in RF Integrated Circuits Ming-Dou KER;Yuan-Wen HSIAO
義守大學 2009-03 Design of High-Voltage-Tolerant ESD Protection Circuit in Low-Voltage CMOS Processes Ming-Dou Ker;Chang-Tzu Wang
義守大學 2009-03 Design of Power-Rail ESD Clamp Circuit With Ultra-Low Standby Leakage Current in Nanoscale CMOS Technology Chang-Tzu Wang;Ming-Dou Ker
義守大學 2008-12 Investigation on Board-Level CDM ESD Issue in IC Products Ming-Dou Ker;Yuan-Wen Hsiao
義守大學 2008-11 Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology Ming-Dou Ker;Tai-Hsiang Lai
義守大學 2008-11 Investigation and Design of On-Chip Power-Rail ESD Clamp Circuits Without Suffering Latchup-Like Failure During System-Level ESD Test Ming-Dou Ker;Cheng-Cheng Yen

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