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机构 日期 题名 作者
臺大學術典藏 2021-12-30T03:02:02Z Optoelectronic properties of Cu3N thin films deposited by reactive magnetron sputtering and its diode rectification characteristics S.-C. Chen; S.-Y. Huang; S. Sakalley; A. Paliwal; Y.-H. Chen; M.-H. Liao; H. Sun; S. Biring; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:02:01Z SiGe Quantum Well Metal-Insulator-Semiconductor Light-Emitting Diodes M.-H. Liao; C.-H. Chen; L.-C. Chang; C. Yang; S.-C. Kao; C.-F. Hsieh; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:02:01Z Strain Engineering of Nanoscale Strained Si MOS Devices B.-F. Hsieh; S. T. Chang; W.-C.Wang; M.-H. Liao; C.-C. Lee; J. Huang; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:02:00Z The Demonstration of High-Performance Multilayer BaTiO3/BiFeO3 Stack MIM Capacitors C. Lien; C.-F. Hsieh; H.-S. Wu; T.-C. Wu; S.-J. Wei; Y.-H. Chu; M.-H. Liao; M.-H. Lee; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:02:00Z Studies of boron diffusivities on (001) and (110) substrate orientation in Si and Ge along vertical/out-of plane and lateral/in-plane directions by SIMS and C-V measurement on the designed test pattern M.-H. Liao; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:02:00Z The demonstration of colossal magneto-capacitance and “negative” capacitance effect with the promising characteristics of Jg-EOT and transistor’s performance on Ge (100) n-FETs by the novel magnetic gate stack scheme design M.-H. Liao; S. C. Huang; C. Y. Liu; P. G. Chen; S. C. Kao; C. Lien; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:01:59Z The investigation on Dislocation Edge Stress Effects for Si N-MOSFETs M.-H. Liao; C.-H. Chen; L.-C. Chang; C. Yang; S.-C. Kao; C.-F. Hsieh; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:01:59Z The investigation of self-heating effect on Si1-xGex FinFETs with different device structures, Ge concentration, and operated voltages M.-H. Liao; C.-P. Hsieh; C.-C. Lee; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:01:59Z The Dependence of the Performance of Strained NMOSFETs on Channel Width Lingyen Yeh; Ming Han Liao; Chun Heng Chen; Jun Wu; Joseph Ya-min Lee; Chee Wee Liu; T. L. Lee; M. S. Liang; MING-HAN LIAO
臺大學術典藏 2021-12-30T03:01:58Z Local stress determination in shallow trench insulator structures with one side and two sides pad SiN layer by polarized micro-Raman spectroscopy extraction and mechanical modelization M. H. Liao; MING-HAN LIAO

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