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Institution Date Title Author
義守大學 2010-11 Relationship between wafer edge design and its ultimate mechanical strength Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2010-10 Relationship between wafer fracture reduction and controlling during the edge manufacturing process Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2010-02 Relationship between wafer fracture reduction and controlling during the edge manufacturing process Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang
義守大學 2009-12 Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學 2009-03 The Impact of Strain Technology on FUSI Gate SOI CMOSFET Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen

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