義守大學 |
2010-11 |
Relationship between wafer edge design and its ultimate mechanical strength
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Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
義守大學 |
2010-10 |
Relationship between wafer fracture reduction and controlling during the edge manufacturing process
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Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
義守大學 |
2010-02 |
Relationship between wafer fracture reduction and controlling during the edge manufacturing process
|
Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang |
義守大學 |
2009-12 |
Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering
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Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang |
義守大學 |
2009-03 |
The Impact of Strain Technology on FUSI Gate SOI CMOSFET
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Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen |