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| 國立交通大學 |
2014-12-08T15:22:53Z |
Investigation of Hot-Carrier Stress Effect on High-Frequency Performance of Laterally Diffused Metal-Oxide-Semiconductor Transistors
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Chen, Kun-Ming; Mou, Zong-Wen; Kuo, Hao-Chung; Chiu, Chia-Sung; Chen, Bo-Yuan; Liu, Wen-De; Chen, Ming-Yi; Yang, Yu-Chi; Wang, Kai-Li; Huang, Guo-Wei |
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