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"ney v"的相关文件
显示项目 1-6 / 6 (共1页)
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| 臺大學術典藏 |
2019-12-27T07:50:00Z |
Structural, optical, and magnetic properties of Ho-implanted GaN thin films
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MING-YAU CHERN; Massies, J.; Wieck, A.D.; Reuter, D.; Pezzagna, S.; Melnikov, A.; Chern, M.-Y.; Ney, A.; Ney, V.; Guo, J.-Y.; Lo, F.-Y.; Lo, F.-Y.;Guo, J.-Y.;Ney, V.;Ney, A.;Chern, M.-Y.;Melnikov, A.;Pezzagna, S.;Reuter, D.;Wieck, A.D.;Massies, J. |
| 臺大學術典藏 |
2019-12-27T07:50:00Z |
Structural, optical, and magnetic properties of Ho-implanted GaN thin films
|
MING-YAU CHERN; Massies, J.; Wieck, A.D.; Reuter, D.; Pezzagna, S.; Melnikov, A.; Chern, M.-Y.; Ney, A.; Ney, V.; Guo, J.-Y.; Lo, F.-Y.; Lo, F.-Y.;Guo, J.-Y.;Ney, V.;Ney, A.;Chern, M.-Y.;Melnikov, A.;Pezzagna, S.;Reuter, D.;Wieck, A.D.;Massies, J. |
| 臺大學術典藏 |
2018-09-10T14:54:15Z |
Structural, optical, and magnetic properties of highly-resistive Sm-implanted GaN thin films
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Huang, C.-D.; Chou, K.-C.; Guo, J.-Y.; Liu, H.-L.; Ney, V.; Ney, A.; Shvarkov, S.; Pezzagna, S.; Reuter, D.; Chia, C.-T.; Chern, M.-Y.; Wieck, A.D.; Massies, J.; Lo, F.-Y.; MING-YAU CHERN et al. |
| 臺大學術典藏 |
2018-09-10T14:54:15Z |
Evidences of defect contribution in magnetically ordered Sm-implanted GaN
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Guo, J.-Y.; Huang, C.-D.; Chou, K.-C.; Liu, H.-L.; Ney, V.; Ney, A.; Chern, M.-Y.; Shvarkov, S.; Reuter, D.; Wieck, A.D.; Pezzagna, S.; Massies, J.; Lo, F.-Y.; MING-YAU CHERNet al. |
| 臺大學術典藏 |
2018-09-10T08:36:15Z |
Structural, optical, and magnetic properties of Ho-implanted GaN thin films
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Lo, F.-Y.;Guo, J.-Y.;Ney, V.;Ney, A.;Chern, M.-Y.;Melnikov, A.;Pezzagna, S.;Reuter, D.;Wieck, A.D.;Massies, J.; Lo, F.-Y.; Guo, J.-Y.; Ney, V.; Ney, A.; Chern, M.-Y.; Melnikov, A.; Pezzagna, S.; Reuter, D.; Wieck, A.D.; Massies, J. |
| 臺大學術典藏 |
2018-09-10T08:36:15Z |
Structural, optical, and magnetic properties of Ho-implanted GaN thin films
|
Lo, F.-Y.;Guo, J.-Y.;Ney, V.;Ney, A.;Chern, M.-Y.;Melnikov, A.;Pezzagna, S.;Reuter, D.;Wieck, A.D.;Massies, J.; Lo, F.-Y.; Guo, J.-Y.; Ney, V.; Ney, A.; Chern, M.-Y.; Melnikov, A.; Pezzagna, S.; Reuter, D.; Wieck, A.D.; Massies, J. |
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