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"oates anthony s"
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| 國立交通大學 |
2014-12-08T15:48:26Z |
Geometric Variability of Nanoscale Interconnects and Its Impact on the Time-Dependent Breakdown of Cu/Low-k Dielectrics
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Lee, Shou-Chung; Oates, Anthony S.; Chang, Kow-Ming |
| 國立交通大學 |
2014-12-08T15:15:12Z |
New understanding of metal-insulator-metal (MIM) capacitor degradation behavior
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Hung, Chi-Chao; Oates, Anthony S.; Lin, H. C.; Chang, Percy; Wang, J. L.; Huang, C. C.; Yau, Y. W. |
| 國立交通大學 |
2014-12-08T15:13:23Z |
An innovative understanding of metal-insulator-metal (MIM)-capacitor degradation under constant-current stress
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Hung, Chi-Chao; Oates, Anthony S.; Lin, Horng-Chih; Chang, Yu-En Percy; Wang, Jia-Lian; Huang, Cheng-Chung; Yau, You-Wen |
Showing items 1-3 of 3 (1 Page(s) Totally)
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