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Showing items 41-43 of 43 (2 Page(s) Totally) << < 1 2 View [10|25|50] records per page
臺大學術典藏 |
2007 |
Evaluating the business value of RFID: Evidence from five case studies
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Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun; Tzeng, Shiou-Fen; Chen, Wun-Hwa; Pai, Fan-Yun |
國立臺灣大學 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
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Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
臺大學術典藏 |
2006-02 |
A WIP-based Exception Management Model for Integrated Circuit Back-end Production Processes
|
Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun; Guo, Ruey-Shan; Chiang, David M.; Pai, Fan-Yun |
Showing items 41-43 of 43 (2 Page(s) Totally) << < 1 2 View [10|25|50] records per page
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