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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:33:02Z |
Method for Determining the Angle in Two Dimension Nanoscale: Pitch Grating
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Pan, Shan-Peng; Liu, Tzong-Shi; Tasi, Min-Ching; Liou, Huay-Chung |
| 國立交通大學 |
2014-12-08T15:33:00Z |
Grating Pitch Measurement Beyond the Diffraction Limit with Modified Laser Diffractometry
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Pan, Shan-Peng; Liu, Tzong-Shi; Tasi, Min-Ching; Liou, Huay-Chung |
| 國立交通大學 |
2014-12-08T15:13:39Z |
Liquid refractometer based on immersion diffractometry
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Lu, Sheng-Hua; Pan, Shan-Peng; Liu, Tzong-Shi; Kao, Ching-Fen |
| 國立交通大學 |
2014-12-08T15:07:41Z |
Precision Measurement of Sub-50 nm Linewidth by Stitching Double-Tilt Images
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Pan, Shan-Peng; Liou, Huay-Chung; Chen, Chao-Chang A.; Chen, Jr-Rung; Liu, Tzong-Shi |
| 國立交通大學 |
2014-12-08T15:07:41Z |
Uncertainty Analysis on Precision Measurement for Polystyrene Nanospheres Using Dynamic Light Scattering
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Pan, Shan-Peng; Weng, Han-Fu; Lin, Chih-Min; Liu, Tzong-Shi |
Showing items 1-5 of 5 (1 Page(s) Totally)
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