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Institution Date Title Author
元培科技大學 2009 Photolithography Control in Wafer Fabrication Based on Process Capability Indices with Multiple Characteristics Pearn; W. L.; Kang; H. Y.; Lee; A. H. I.; Liao; M. Y
元培科技大學 2007 Estimating and Testing Process Precision with Presence of Gauge Measurement Errors. Pearn; W. L. and Liao; M. Y.
元培科技大學 2006 One-sided Process Capability Assessment in the Presence of Measurement Errors. Pearn; W. L. and Liao; M. Y.
元培科技大學 2005 Measuring Process Capability Based on Cpk with Gauge Measurement Errors. Pearn; W. L. and Liao; M. Y.

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