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Showing items 161-182 of 182 (8 Page(s) Totally) << < 1 2 3 4 5 6 7 8 > >> View [10|25|50] records per page
| 國立勤益科技大學 |
2003 |
Distributional properties and implications of the estimated process incapability index
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Lin, P.C. ; Pearn, W.L. ; Chen, K. S. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
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Chen, Jann-Pygn ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
One-sided capability indices Cpu and Cpl: decision making with sample information
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Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
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Lin, P.-C. ; Pearn, W.L. |
| 國立勤益科技大學 |
2002 |
A Practical Implementation of the Incapability Index Cpp
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Pearn, W.L. ; Chen, K.L. ; Chen, K.S. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
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Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C. |
| 國立勤益科技大學 |
2001 |
Estimating process capability index C”pmk asymmetric tolerances: distributional properties
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Pearn, W.L.; Lin, P.C.; Chen, K.S. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
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Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C. |
| 國立勤益科技大學 |
2001 |
Estimating process capability index C”pmk for asymmetric tolerances: Distributional properties
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Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S. |
| 國立勤益科技大學 |
2001 |
Capability indices for processes with asymmetric tolerances
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Chen, K.S. ; Pearn, W.L. |
| 國立勤益科技大學 |
1999 |
Making decisions in assessing process capability index Cpk
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Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
1999 |
A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances
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Pearn, W.L. ; Chen, K.S. ; Lin, G.H. |
| 國立勤益科技大學 |
1999 |
A new generalization of Cpm for processes with asymmetric tolerances
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Chen, K.-S.;Pearn, W.L.; Lin, P.-C. |
| 國立勤益科技大學 |
1999 |
A new generalization of Cpm for processes with asymmetric tolerances
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Chen, K.S. ; Pearn, W.L. ; Lin, P.C. |
| 國立勤益科技大學 |
1998 |
Distributional and inferential properties of the process accuracy and process precision indices
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Pearn, W.L. ; Lin, G.H. ; Chen, K.S. |
| 國立勤益科技大學 |
1998 |
New generalization of the process capability index Cpk
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Pearn, W.L. ; Chen, K.S. |
| 國立勤益科技大學 |
1997 |
Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
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Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
1997 |
A practical implementation of the process capability index Cpk
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Pearn, W.L.; Chen, K.S. |
| 國立勤益科技大學 |
1997 |
An application of non-normal Process capability indices
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Chen, K.S. ; Pearn, W.L. |
| 國立勤益科技大學 |
1997 |
Multi-process performance analysis: a case study
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Pearn, W.L. ; Chen, K.S. |
| 國立勤益科技大學 |
1996 |
A Bayesian-like estimator of Cpk
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Pearn, W.L. ; Chen, K.S. |
| 國立勤益科技大學 |
1995 |
Estimating process capability indices for non-normal Pearsonian populations
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Pearn, W.L. ; Chen, K.S. |
Showing items 161-182 of 182 (8 Page(s) Totally) << < 1 2 3 4 5 6 7 8 > >> View [10|25|50] records per page
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