| 國立交通大學 |
2014-12-08T15:21:51Z |
ANALYTICAL METHOD FOR ACCURACY ANALYSIS OF THE RANDOMIZED T-POLICY QUEUE
|
Wang, Kuo-Hsiung; Yang, Dong-Yuh; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:21:23Z |
Production yield measure for multiple characteristics processes based on S-pk(T) under multiple samples
|
Pearn, W. L.; Yen, Ching-Ho; Yang, Dong-Yuh |
| 國立交通大學 |
2014-12-08T15:21:13Z |
An Integrated Multi-Criteria Decision Making Model for Evaluating Wind Farm Performance
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Kang, He-Yau; Hung, Meng-Chan; Pearn, W. L.; Lee, Amy H. I.; Kang, Mei-Sung |
| 國立交通大學 |
2014-12-08T15:21:02Z |
An Effective Test for Supplier Selection Evaluation with Multiple Characteristics
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Tai, Y. T.; Pearn, W. L.; You, S. K. |
| 國立交通大學 |
2014-12-08T15:20:59Z |
Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C(pk)
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Pearn, W. L.; Shiau, J. -J. H.; Tai, Y. T.; Li, M. Y. |
| 國立交通大學 |
2014-12-08T15:20:51Z |
Efficient Tool Replacement Procedure Based on Yield Evaluation
|
Lin, Chen-ju; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:20:49Z |
Two Tests for Supplier Selection Based on Process Yield
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Pearn, W. L.; Liao, Mou-Yuan; Wu, Chien-Wei; Chu, Yao-Tsung |
| 國立交通大學 |
2014-12-08T15:20:48Z |
Process Capability Evaluation for Square Bumps with Mean Shift
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Pearn, W. L.; Hung, H. N.; Tai, Y. T.; Hou, H. H. |
| 國立交通大學 |
2014-12-08T15:20:33Z |
Optimal production run time for two-stage production system with imperfect processes and allowable shortages
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Pearn, W. L.; Su, R. H.; Weng, M. W.; Hsu, C. H. |
| 國立交通大學 |
2014-12-08T15:16:25Z |
Multiple-process performance analysis chart based on process loss indices
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Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:41Z |
Precision measures for processes with multiple manufacturing lines
|
Pearn, W. L.; Chang, C. S. |
| 國立交通大學 |
2014-12-08T15:15:33Z |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:15:31Z |
One-sided process capability assessment in the presence of measurement errors
|
Pearn, W. L.; Liao, Mou-Yuan |
| 國立交通大學 |
2014-12-08T15:15:29Z |
Measuring production yield for processes with multiple quality characteristics
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Pearn, W. L.; Wang, F. K.; Yen, C. H. |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Measuring process performance based on expected loss with asymmetric tolerances
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Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Accuracy analysis of the percentile method for estimating non normal manufacturing quality
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Wu, Chien-Wei; Pearn, W. L.; Chang, C. S.; Chen, H. C. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
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Chang, Y. C.; Pearn, W. L.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Multivariate capability indices: Distributional and inferential properties
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Pearn, W. L.; Wang, F. K.; Yen, C. H. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
Optimal management for a finite M/M/R queueing system with two arrival modes
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Wang, Kuo-Hsiung; Ke, Jyh-Bin; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
A comparison of two methods for transforming non-normal manufacturing data
|
Chung, S. H.; Pearn, W. L.; Yang, Y. S. |
| 國立交通大學 |
2014-12-08T15:15:00Z |
Estimating process yield based on S-pk for multiple samples
|
Pearn, W. L.; Cheng, Ya Ching |
| 國立交通大學 |
2014-12-08T15:14:47Z |
An effective decision making method for product acceptance
|
Pearn, W. L.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:14:22Z |
Scheduling integrated circuit assembly operations on die bonder
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Pearn, W. L.; Chung, S. H.; Lai, C. M. |
| 國立交通大學 |
2014-12-08T15:14:10Z |
Due-date assignment for wafer fabrication under demand variate environment
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Pearn, W. L.; Chung, S. H.; Lai, C. A. |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Measuring process capability based on Cpmk with gauge measurement errors
|
Hsu, B. M.; Shu, M. H.; Pearn, W. L. |
