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機構	日期	題名	作者
國立交通大學	2014-12-08T15:07:43Z	Procedure of the convolution method for estimating production yield with sample size information	Pearn, W. L.; Hung, Hui Nien; Cheng, Ya Ching; Lin, Gu Hong
國立交通大學	2014-12-08T15:07:43Z	Measuring production yield for processes with multiple characteristics	Pearn, W. L.; Cheng, Ya-Ching
國立交通大學	2014-12-08T15:07:07Z	Process Selection for Higher Production Yield Based on Capability Index S(pk)	Lin, Chen-ju; Pearn, W. L.
國立交通大學	2014-12-08T15:07:06Z	Measuring Manufacturing Yield for Gold Bumping Processes Under Dynamic Variance Change	Pearn, W. L.; Tai, Y. T.; Chiang, W. L.
國立交通大學	2014-12-08T15:06:52Z	Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup	Wang, Kuo-Hsiung; Yang, Dong-Yuh; Pearn, W. L.
國立臺灣科技大學	2011	Two Tests for Supplier Selection Based on Process Yield	Pearn, W.L.;Liao, M.Y.;Wu, C.W.;Chu, Y.T.
國立臺灣科技大學	2010	Estimating and testing process accuracy with extension to asymmetric tolerances	Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Tai, Y. C.
國立臺灣科技大學	2009	An overview of theory and practice on process capability indices for quality assurance	Wu, Chien-Wei; Pearn, W. L. ; Kotz, S.
國立臺灣科技大學	2009	A comparison of methods for estimating loss-based capability index	Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Cheng, F. T.
元培科技大學	2009	Sample size determination for production yield estimation with multiple independent process characteristics	Hsu, Ya Chen; Pearn, W. L.; Ya Fei Chuang
國立高雄應用科技大學	2008	Bootstrap approach for supplier selection based on production yield	蘇明鴻; WU, C.-W.; SHU, M. H.; PEARN, W. L.; LIU, K. H.
國立聯合大學	2008	Solution strategies for multi-stage wafer probing scheduling problem with reentry	Pearn, W.L. ; Chung, S.H.; Yang, M.H.; Shiao, K.P.
國立臺灣科技大學	2008	A variables sampling plan based on Cpmk for product acceptance determination	Wu, Chien-Wei; Pearn, W. L.
國立臺灣科技大學	2008	Bootstrap approach for supplier selection based on production yield	Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Liu, K. H.
元培科技大學	2008	Capability Adjustment for Gamma Processes with Mean Shift Consideration in Implementing Six Sigma Program	Hsu, Ya Chen; Pearn, W. L.; Pei Ching Wu
國立臺灣科技大學	2007	Accuracy analysis of the percentile method for estimating non-normal manufacturing quality	Wu, Chien-Wei; Pearn, W. L. ; Chang, C. S. ; Chen, H. C.
國立臺灣科技大學	2007	On the sampling distributions of the estimated process loss indices with asymmetric tolerances	Chang, Y. C. ; Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2007	Multivariate capability indices: distributional and inferential properties	Pearn, W. L. ; Wang, F. K. ; Yen, C. H.
國立臺灣科技大學	2007	An effective decision making method for product acceptance	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2007	Accuracy in Estimating Process Capability Analysis	Pearn, W. L. ; Wu, Chien-Wei
元培科技大學	2007	Optimal Tool Replacement for Processes with Low Fraction Defective,	Pearn, W. L. ; Hsu, Ya Chen
元培科技大學	2007	Optimal Tool Replacement Policy for one-sided Processes with Low Fraction Defective,	Pearn, W. L.; Hsu, Ya Chen; Shiau, H. J.
國立臺灣科技大學	2006	Production quality and yield assurance for processes with multiple independent characteristics	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Quality yield measure for processes with asymmetric tolerances	Pearn, W. L. ; Lin, P. C. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL	Wu, Chien-Wei; Pearn, W. L.
國立臺灣科技大學	2006	Tool replacement for production with a low fraction of defectives	Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring production yield for processes with multiple quality characteristics	Pearn, W. L. ; Wang, F. K. ; Yen, C. H.
國立臺灣科技大學	2006	Multi-process performance analysis chart based on process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring process performance based on expected loss for asymmetric tolerances	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Variables sampling plans with PPM fraction of defectives and process loss consideration	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives	Pearn, W. L. ; Wu, Chien-Wei
元培科技大學	2006	Tool Replacement for Production with Low Fraction Defective,	Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei
大葉大學	2005-06	A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index	Lin, G. H.;Pearn, W. L.;Yang, Y. S.
國立高雄應用科技大學	2005	Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk	PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻
國立臺灣科技大學	2005	A Bayesian approach for assessing process precision based on multiple samples	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing	Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H.
國立臺灣科技大學	2005	Measuring manufacturing capability for couplers and wavelength division multiplexers	Wu, Chien-Wei; Pearn, W. L.
國立臺灣科技大學	2005	Bootstrap approach for estimating process quality yield with application to light emitting diodes	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples	Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C.
國立臺灣科技大學	2005	An effective modern approach for measuring high-tech product manufacturing process quality	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Process capability assessment for index Cpk based on Bayesian approach	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability testing based on Cpm with multiple samples	Wu, Chien-Wei; Pearn, W. L.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L.; Lin, P.C.; Chen, K.S.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S.
國立勤益科技大學	2004	Testing process performance based on capability indexCpk with critical values	Pearn, W.L. ; Lin, P.-C.
國立臺灣科技大學	2004	Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes	Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C.
國立臺灣科技大學	2004	Quality-yield measure for production with very low fraction of defectives	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2004	Distributional and inferential properties of the process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
大葉大學	2003-06	Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples	Pearn, W. L.;Yang, Y. S.
國立勤益科技大學	2003	Capability Measures For processes With Multiple Characteristics	Chen, K.S.; Pearn, W.L.; Lin, P.C.

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