| 國立交通大學 |
2014-12-08T15:29:44Z |
Measuring PPM Non-conformities for Processes with Asymmetric Tolerances
|
Pearn, W. L.; Wu, C. H. |
| 國立交通大學 |
2014-12-08T15:29:40Z |
Comparative analysis of a randomized N-policy queue: An improved maximum entropy method
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Wang, Kuo-Hsiung; Yang, Dong-Yuh; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:29:25Z |
A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk"
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Pearn, W. L.; Wu, C. H.; Tsai, M. C. |
| 國立交通大學 |
2014-12-08T15:29:25Z |
An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics
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Pearn, W. L.; Wu, C. H.; Hung, H. N.; Kao, C. M. |
| 國立交通大學 |
2014-12-08T15:29:19Z |
Profitability evaluation for newsboy-type product with normally distributed demand
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Su, R. H.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:29:14Z |
Profitability evaluation for newsboy-type product with normally distributed demand
|
Su, R. H.; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:29:08Z |
The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
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Pearn, W. L.; Hong, J. S.; Tai, Y. T. |
| 國立交通大學 |
2014-12-08T15:29:01Z |
A wind turbine evaluation model under a multi-criteria decision making environment
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Lee, Amy H. I.; Hung, Meng-Chan; Kang, He-Yau; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:28:33Z |
Precision Tool Condition Monitoring for Grinding Wheel in IC Manufacturing of Silicon Wafer
|
Hsu, Ya-Chen; Pearn, W. L.; Chuang, Ya-Fei |
| 國立交通大學 |
2014-12-08T15:27:21Z |
The Interrelationship Between N-policy M/G/1/K and F-policy G/M/1/K Queues with Startup Time
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Kuo, Ching-Chang; Wang, Kuo-Hsiung; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:24:05Z |
An Effective Powerful Test for Supplier Selection Evaluation with Multiple Characteristics
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Pearn, W. L.; Tai, Y. T.; Wang, C. Y. |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Implementation of Evaluating Process Capability Index C-pk for Processes with Multiple Characteristics
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Pearn, W. L.; Wu, C. H. |
| 國立交通大學 |
2014-12-08T15:23:16Z |
Measuring the Manufacturing Yield for Processes With Multiple Manufacturing Lines
|
Tai, Y. T.; Pearn, W. L.; Kao, Chun-Min |
| 國立交通大學 |
2014-12-08T15:22:56Z |
Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
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Tai, Y. T.; Pearn, W. L.; Lee, J. H. |
| 國立交通大學 |
2014-12-08T15:22:35Z |
An Effective Procedure for Calculating Weibull Production Yield with Mean Shift
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Hsu, Ya-Chen; Pearn, W. L.; Li, Yuan-Yi |
| 國立交通大學 |
2014-12-08T15:21:51Z |
ANALYTICAL METHOD FOR ACCURACY ANALYSIS OF THE RANDOMIZED T-POLICY QUEUE
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Wang, Kuo-Hsiung; Yang, Dong-Yuh; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:21:23Z |
Production yield measure for multiple characteristics processes based on S-pk(T) under multiple samples
|
Pearn, W. L.; Yen, Ching-Ho; Yang, Dong-Yuh |
| 國立交通大學 |
2014-12-08T15:21:13Z |
An Integrated Multi-Criteria Decision Making Model for Evaluating Wind Farm Performance
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Kang, He-Yau; Hung, Meng-Chan; Pearn, W. L.; Lee, Amy H. I.; Kang, Mei-Sung |
| 國立交通大學 |
2014-12-08T15:21:02Z |
An Effective Test for Supplier Selection Evaluation with Multiple Characteristics
|
Tai, Y. T.; Pearn, W. L.; You, S. K. |
| 國立交通大學 |
2014-12-08T15:20:59Z |
Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index C(pk)
|
Pearn, W. L.; Shiau, J. -J. H.; Tai, Y. T.; Li, M. Y. |
| 國立交通大學 |
2014-12-08T15:20:51Z |
Efficient Tool Replacement Procedure Based on Yield Evaluation
|
Lin, Chen-ju; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:20:49Z |
Two Tests for Supplier Selection Based on Process Yield
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Pearn, W. L.; Liao, Mou-Yuan; Wu, Chien-Wei; Chu, Yao-Tsung |
| 國立交通大學 |
2014-12-08T15:20:48Z |
Process Capability Evaluation for Square Bumps with Mean Shift
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Pearn, W. L.; Hung, H. N.; Tai, Y. T.; Hou, H. H. |
| 國立交通大學 |
2014-12-08T15:20:33Z |
Optimal production run time for two-stage production system with imperfect processes and allowable shortages
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Pearn, W. L.; Su, R. H.; Weng, M. W.; Hsu, C. H. |
| 國立交通大學 |
2014-12-08T15:16:25Z |
Multiple-process performance analysis chart based on process loss indices
|
Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |