臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

關於TAIR
	計畫說明

瀏覽
	典藏機構
	作者
	題名
	日期
	統計圖表
	機構即時統計
	學術趨勢

消息
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

著作權
	出版社及期刊政策查詢
	TAIR著作權會議記錄

相關連結
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"pearn w l"的相關文件

回到依作者瀏覽
依題名排序	依日期排序

顯示項目 136-182 / 182 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目

機構	日期	題名	作者
國立臺灣科技大學	2006	Tool replacement for production with a low fraction of defectives	Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring production yield for processes with multiple quality characteristics	Pearn, W. L. ; Wang, F. K. ; Yen, C. H.
國立臺灣科技大學	2006	Multi-process performance analysis chart based on process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring process performance based on expected loss for asymmetric tolerances	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Variables sampling plans with PPM fraction of defectives and process loss consideration	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives	Pearn, W. L. ; Wu, Chien-Wei
元培科技大學	2006	Tool Replacement for Production with Low Fraction Defective,	Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei
大葉大學	2005-06	A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index	Lin, G. H.;Pearn, W. L.;Yang, Y. S.
國立高雄應用科技大學	2005	Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk	PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻
國立臺灣科技大學	2005	A Bayesian approach for assessing process precision based on multiple samples	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing	Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H.
國立臺灣科技大學	2005	Measuring manufacturing capability for couplers and wavelength division multiplexers	Wu, Chien-Wei; Pearn, W. L.
國立臺灣科技大學	2005	Bootstrap approach for estimating process quality yield with application to light emitting diodes	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples	Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C.
國立臺灣科技大學	2005	An effective modern approach for measuring high-tech product manufacturing process quality	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Process capability assessment for index Cpk based on Bayesian approach	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability testing based on Cpm with multiple samples	Wu, Chien-Wei; Pearn, W. L.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L.; Lin, P.C.; Chen, K.S.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S.
國立勤益科技大學	2004	Testing process performance based on capability indexCpk with critical values	Pearn, W.L. ; Lin, P.-C.
國立臺灣科技大學	2004	Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes	Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C.
國立臺灣科技大學	2004	Quality-yield measure for production with very low fraction of defectives	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2004	Distributional and inferential properties of the process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
大葉大學	2003-06	Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples	Pearn, W. L.;Yang, Y. S.
國立勤益科技大學	2003	Capability Measures For processes With Multiple Characteristics	Chen, K.S.; Pearn, W.L.; Lin, P.C.
國立勤益科技大學	2003	Distributional properties and implications of the estimated process incapability index	Lin, P.C. ; Pearn, W.L. ; Chen, K. S.
國立勤益科技大學	2002	Testing process performance based on the yield: an application to the liquid-crystal display module	Chen, Jann-Pygn ; Pearn, W.L.
國立勤益科技大學	2002	One-sided capability indices Cpu and Cpl: decision making with sample information	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	2002	Testing process capability for one-sided specification limit with application to the voltage level translator	Lin, P.-C. ; Pearn, W.L.
國立勤益科技大學	2002	A Practical Implementation of the Incapability Index Cpp	Pearn, W.L. ; Chen, K.L. ; Chen, K.S.
國立勤益科技大學	2001	Testing process capability using the index Cpmk with an application	Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C.
國立勤益科技大學	2001	Estimating process capability index C”pmk asymmetric tolerances: distributional properties	Pearn, W.L.; Lin, P.C.; Chen, K.S.
國立勤益科技大學	2001	Testing process capability using the index Cpmk with an application	Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C.
國立勤益科技大學	2001	Estimating process capability index C”pmk for asymmetric tolerances: Distributional properties	Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S.
國立勤益科技大學	2001	Capability indices for processes with asymmetric tolerances	Chen, K.S. ; Pearn, W.L.
國立勤益科技大學	1999	Making decisions in assessing process capability index Cpk	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1999	A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances	Pearn, W.L. ; Chen, K.S. ; Lin, G.H.
國立勤益科技大學	1999	A new generalization of Cpm for processes with asymmetric tolerances	Chen, K.-S.;Pearn, W.L.; Lin, P.-C.
國立勤益科技大學	1999	A new generalization of Cpm for processes with asymmetric tolerances	Chen, K.S. ; Pearn, W.L. ; Lin, P.C.
國立勤益科技大學	1998	Distributional and inferential properties of the process accuracy and process precision indices	Pearn, W.L. ; Lin, G.H. ; Chen, K.S.
國立勤益科技大學	1998	New generalization of the process capability index Cpk	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1997	Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1997	A practical implementation of the process capability index Cpk	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1997	An application of non-normal Process capability indices	Chen, K.S. ; Pearn, W.L.
國立勤益科技大學	1997	Multi-process performance analysis: a case study	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1996	A Bayesian-like estimator of Cpk	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1995	Estimating process capability indices for non-normal Pearsonian populations	Pearn, W.L. ; Chen, K.S.

顯示項目 136-182 / 182 (共4頁)
<< < 1 2 3 4 > >>
每頁顯示[10|25|50]項目

	English \| 正體中文 \| 简体中文 \| 總筆數 :0
	造訪人次 : 51812572 線上人數 : 891 教育部委託研究計畫計畫執行:國立臺灣大學圖書館